Datasheet

TPS7301Q, TPS7325Q, TPS7330Q, TPS7333Q, TPS7348Q, TPS7350Q
LOW-DROPOUT VOLTAGE REGULATORS
WITH INTEGRATED DELAYED RESET FUNCTION
SLVS124F – JUNE 1995 – REVISED JANUARY 1999
12
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
TPS7348Q electrical characteristics at I
O
= 10 mA, V
I
= 5.85 V, EN = 0 V, C
o
= 4.7 µF (CSR
= 1 ),
SENSE shorted to OUT (unless otherwise noted)
PARAMETER
TEST CONDITIONS
T
J
MIN TYP MAX
UNIT
Out
p
ut voltage
25°C 4.85
V
O
u
tp
u
t
v
oltage
5.85 V V
I
10 V, 5 mA I
O
500 mA –40°C to 125°C 4.75 4.95
V
I
O
=10mA
V
I
= 4 75 V
25°C 2.9 6
I
O
=
10
mA
,
V
I
=
4
.
75
V
–40°C to 125°C 8
Dropout voltage
I
O
= 100 mA
V
I
= 4 75 V
25°C 28 37
mV
D
ropou
t
vo
lt
age
I
O
=
100
mA
,
V
I
=
4
.
75
V
–40°C to 125°C 54
mV
I
O
= 500 mA
V
I
= 4 75 V
25°C 150 180
I
O
=
500
mA
,
V
I
=
4
.
75
V
–40°C to 125°C 250
Pass element series resistance
(4.75 V – V
O
)/I
O
, V
I
= 4.75 V,
25°C 0.28 0.37
Pass
-
element
series
resistance
(
O
)
O
,
I
O
= 500 mA
I
,
–40°C to 125°C 0.52
In
p
ut regulation
V
I
=585Vto10V
50 µA I
O
500 mA
25°C 9 35
mV
Inp
u
t
reg
u
lation
V
I
=
5
.
85
V
to
10
V
,
50
µ
A
I
O
500
mA
–40°C to 125°C 37
mV
I
O
=5mAto500mA 585VV
I
10 V
25°C 28 42
mV
Out
p
ut regulation
I
O
=
5
mA
to
500
mA
,
5
.
85
V
V
I
10
V
–40°C to 125°C 80
mV
O
u
tp
u
t
reg
u
lation
I
O
=50µA to 500 mA 5 85 V V
I
10 V
25°C 42 65
mV
I
O
=
50
µ
A
to
500
mA
,
5
.
85
V
V
I
10
V
–40°C to 125°C 130
mV
I
O
=50µA
25°C 42 53
Ri
pp
le rejection
f = 120 Hz
I
O
=
50
µ
A
–40°C to 125°C 39
dB
Ripple
rejection
f
=
120
H
z
I
O
= 500 mA
25°C 39 50
dB
I
O
=
500
mA
–40°C to 125°C 35
Output noise-spectral density f = 120 Hz 25°C 2 µV/Hz
C
o
= 4.7 µF
25°C 410
Output noise voltage 10 Hz f 100 kHz
C
o
= 10 µF
25°C 328
µVrms
C
o
= 100 µF
25°C 212
RESET trip-threshold voltage
V
O
decreasing –40°C to 125°C 4.5 4.7 V
RESET hysteresis voltage
25°C 26 mV
RESET out
p
ut low voltage
I
O(RESET)
=12mAV
I
= 4 12 V
25°C 0.2 0.4
V
RESET
output
low
voltage
I
O(RESET)
= –
1
.
2
mA
,
V
I
=
4
.
12
V
–40°C to 125°C 0.4
V
CSR refers to the total series resistance, including the ESR of the capacitor, any series resistance added externally, and PWB trace resistance
to C
o
.
Pulse-testing techniques are used to maintain virtual junction temperature as close as possible to ambient temperature; thermal effects must
be taken into account separately.