Datasheet
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SPECIFICATIONS; V
S+
– V
S–
= 3.3 V:
THS4520
SLOS503B – SEPTEMBER 2006 – REVISED JULY 2007
Test conditions unless otherwise noted: V
S+
= +1.65 V, V
S–
= –1.65 V, G = 0 dB, CM = open, V
O
= 1 V
PP
, R
F
= 499 Ω ,
R
L
= 200 Ω Differential, T
A
= 25 ° C Single-Ended Input, Differential Output, Input and Output Referenced to mid-supply
TEST
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
LEVEL
(1)
AC PERFORMANCE
G = 0 dB, V
O
= 100 mV
PP
600 MHz
G = 6 dB, V
O
= 100 mV
PP
400 MHz
Small-Signal Bandwidth
G = 10 dB, V
O
= 100 mV
PP
310 MHz
G = 20 dB, V
O
= 100 mV
PP
120 MHz C
Gain-Bandwidth Product G = 20 dB 1200 MHz
Bandwidth for 0.1 dB flatness G = 6 dB, V
O
= 1 V
PP
30 MHz
Large-Signal Bandwidth G = 0 dB, V
O
= 1 V
PP
210 MHz
Slew Rate (Differential) 320 V/ μ s
Rise Time 4
Fall Time 2-V Step 4 C
ns
Settling Time to 1% 6.6
Settling Time to 0.1% 7.1
f = 100 kHz
(3)
R
L
= 1 k Ω V
OD
= 4 V
PP
–135
V
OD
= 1 V
PP
–107
R
L
= 200 Ω
V
OD
= 2 V
PP
–101
f = 1 MHz
(4)
V
OD
= 1 V
PP
–97
R
L
= 1 k Ω
V
OD
= 2 V
PP
–103 dBc C
2
nd
Order Harmonic Distortion
(2)
V
OD
= 1 V
PP
–108
R
L
= 200 Ω
V
OD
= 2 V
PP
–106
f = 8 MHz
(4)
V
OD
= 1 V
PP
–98
R
L
= 1 k Ω
V
OD
= 2 V
PP
–99
R
L
= 1 k Ω V
OD
= 4 V
PP
–146
f = 100 kHz
(3)
V
OD
= 1 V
PP
–112
R
L
= 200 Ω
V
OD
= 2 V
PP
–105
f = 1 MHz
(4)
V
OD
= 1 V
PP
–94
R
L
= 1 k Ω
dBc C
3
rd
Order Harmonic Distortion
(2)
V
OD
= 2 V
PP
–103
V
OD
= 1 V
PP
–95
R
L
= 200 Ω
V
OD
= 2 V
PP
–90
f = 8 MHz
(4)
V
OD
= 1 V
PP
–95
R
L
= 1 k Ω
V
OD
= 2 V
PP
–102
f
C
= 1 MHz
(4)
, 100-kHz Tone Spacing,
-80
R
L
= 200 Ω , V
OD
= 4 V
PP
envelope, G = 10dB
dBc C
3
rd
Order Intermodulation Distortion
f
C
= 10 MHz
(4)
, 100-kHz Tone Spacing,
-80
R
L
= 200 Ω , V
OD
= 4 V
PP
envelope, G = 10dB
Input Voltage Noise f > 10 kHz 2 nV/ √ Hz
Input Current Noise f > 10 kHz 2 pA/ √ Hz
(1) Test levels: (A) 100% tested at 25 ° C. Overtemperature limits by characterization and simulation. (B) Limits set by characterization and
simulation. (C) Typical value only for information.
(2) For additional information, see the Typical Characteristics section and the Apllications section.
(3) Data collected with applied differential input signal and measured differential output signal.
(4) Data collected with applied single-ended input signal and measured differential output signal. See Figure 55 in the Applications/Test
Circuits section for additional information.
6
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