Datasheet

μA78L00
www.ti.com SLVS010U –JANUARY 1976–REVISED MAY 2011
uA78L06 Electrical Characteristics
at specified virtual junction temperature, V
I
= 12 V, I
O
= 40 mA (unless otherwise noted)
μA78L06C μA78L06AC
PARAMETER TEST CONDITIONS T
J
(1)
UNIT
MIN TYP MAX MIN TYP MAX
25°C 5.7 6.2 6.7 5.95 6.2 6.45
V
I
= 8.5 V to 20 V,
I
O
= 1 mA to 40 mA
Output voltage 0°C to 125°C 5.6 6.8 5.9 6.5 V
I
O
= 1 mA to 70 mA 0°C to 125°C 5.6 6.8 5.9 6.5
V
I
= 8.5 V to 20 V 35 200 35 175
Input voltage
25°C mV
regulation
V
I
= 9 V to 20 V 29 150 29 125
V
I
= 10 V to 20 V,
Ripple rejection 25°C 39 48 40 48 dB
f = 120 Hz
I
O
= 1 mA to 100 mA 16 80 16 80
Output voltage
25°C mV
regulation
I
O
= 1 mA to 40 mA 9 40 9 40
Output noise
f = 10 Hz to 100 kHz 25°C 46 46 μV
voltage
Dropout voltage 25°C 1.7 1.7 V
25°C 3.9 6 3.9 6
Bias current mA
125°C 5.5 5.5
V
I
= 9 V to 20 V 1.5 1.5
Bias current
0°C to 125°C mA
change
I
O
= 1 mA to 40 mA 0.2 0.1
(1) Pulse-testing techniques maintain T
J
as close to T
A
as possible. Thermal effects must be taken into account separately. All
characteristics are measured with a 0.33-μF capacitor across the input and a 0.1-μF capacitor across the output.
uA78L08 Electrical Characteristics
at specified virtual junction temperature, V
I
= 14 V, I
O
= 40 mA (unless otherwise noted)
μA78L08C μA78L08AC
PARAMETER TEST CONDITIONS T
J
(1)
UNIT
MIN TYP MAX MIN TYP MAX
25°C 7.36 8 8.64 7.7 8 8.3
V
I
= 10.5 V to 23 V,
I
O
= 1 mA to 40 mA
Output voltage 0°C to 125°C 7.2 8.8 7.6 8.4 V
I
O
= 1 mA to 70 mA 0°C to 125°C 7.2 8.8 7.6 8.4
V
I
= 10.5 V to 23 V 42 200 42 175
Input voltage
25°C mV
regulation
V
I
= 11 V to 23 V 36 150 36 125
V
I
= 13 V to 23 V,
Ripple rejection 25°C 36 46 37 46 dB
f = 120 Hz
I
O
= 1 mA to 100 mA 18 80 18 80
Output voltage
25°C mV
regulation
I
O
= 1 mA to 40 mA 10 40 10 40
Output noise
f = 10 Hz to 100 kHz 25°C 54 54 μV
voltage
Dropout voltage 25°C 1.7 1.7 V
25°C 4 6 4 6
Bias current mA
125°C 5.5 5.5
V
I
= 11 V to 23 V 1.5 1.5
Bias current
0°C to 125°C mA
change
I
O
= 1 mA to 40 mA 0.2 0.1
(1) Pulse-testing techniques maintain T
J
as close to T
A
as possible. Thermal effects must be taken into account separately. All
characteristics are measured with a 0.33-μF capacitor across the input and a 0.1-μF capacitor across the output.
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