Datasheet

4" 4 mil Stripline
40" 4
mil
Stripline
AWG
Jitter
Measurement
CP
SN75LVCP600S
www.ti.com SLLSE81 –MARCH 2011
ELECTRICAL CHARACTERISTICS (continued)
over recommended operating conditions (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNITS
TRANSMITTER JITTER AT CP
(1)
3Gbps SATA mode
TJ
TX
Total jitter
(1)
0.26 0.38 UI
pp
V
ID
= 500 mV
pp
, UI = 333ps, K28.5 control character,
DJ
TX
Deterministic jitter 0.13 0.24 UI
pp
EQ/DE=1
V
ID
= 500 mV
pp
, UI = 333ps, K28.7 control character,
RJ
TX
Residual random jitter 1.16 1.95 ps-rms
EQ/DE=1
6Gbps SATA mode
TJ
TX
Total jitter
(1)
0.37 0.61 UI
pp
V
ID
= 500 mV
pp
, UI = 167ps, K28.5 control character,
DJ
TX
Deterministic jitter 012 0.32 UI
pp
EQ/DE=1
V
ID
= 500 mV
pp
, UI = 167ps, K28.7 control character,
RJ
TX
Residual random jitter 1.15 2.2 ps-rms
EQ/DE=1
3Gbps SAS mode
TJ
TX
Total jitter
(1)
0.25 0.37 UI
pp
V
ID
= 500 mV
pp
, UI = 333ps, K28.5 control character,
DJ
TX
Deterministic jitter 0.12 0.23 UI
pp
EQ/DE=1
V
ID
= 500 mV
pp
, UI = 333ps, K28.7 control character,
RJ
TX
Residual random jitter 1.11 2.0 ps-rms
EQ/DE=1
6Gbps SAS mode
TJ
TX
Total jitter
(1)
0.35 0.57 UI
pp
V
ID
= 500 mV
pp
, UI = 167ps, K28.5 control character,
DJ
TX
Deterministic jitter 0.10 0.29 UI
pp
EQ/DE=1
V
ID
= 500 mV
pp
, UI = 167ps, K28.7 control character,
RJ
TX
Residual random jitter 1.10 2.14 ps-rms
EQ/DE=1
(1) T
J
= (14.1×RJ
SD
+ DJ) where RJ
SD
is one standard deviation value of RJ Gaussian distribution. Jitter measurement is at the CP
connector and includes jitter generated at the package connection on the printed circuit board, and at the board interconnect as shown
in Figure 6.
Figure 6. Jitter Measurement Test Condition
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