Datasheet

LMV841, LMV842, LMV844
www.ti.com SNOSAT1G –OCTOBER 2006–REVISED FEBRUARY 2013
Operating Ratings
(1)
Temperature Range
(2)
−40°C to +125°C
Supply Voltage (V
+
– V
−
) 2.7V to 12V
Package Thermal Resistance [θ
JA
(2)
]
5-Pin SC70 334 °C/W
8-Pin VSSOP 205 °C/W
8-Pin SOIC 126 °C/W
14-Pin TSSOP 110 °C/W
14-Pin SOIC 93 °C/W
(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test
conditions, see the Electrical Characteristics Tables.
(2) The maximum power dissipation is a function of T
J(MAX)
, θ
JA
, and T
A
. The maximum allowable power dissipation at any ambient
temperature is P
D
= (T
J(MAX)
- T
A
) / θ
JA
. All numbers apply for packages soldered directly onto a PC board.
3.3V Electrical Characteristics
(1)
Unless otherwise specified, all limits are guaranteed for T
A
= 25°C, V
+
= 3.3V, V
−
= 0V, V
CM
= V
+
/2, and R
L
> 10MΩ to V
+
/2.
Boldface limits apply at the temperature extremes.
Min Typ Max
Symbol Parameter Conditions Units
(2) (3) (2)
±50 ±500
V
OS
Input Offset Voltage μV
±800
TCV
OS
Input Offset Voltage Drift
(4)
0.5 ±5 μV/°C
Input Bias Current 0.3 10
I
B
pA
(4) (5)
300
I
OS
Input Offset Current 40 fA
Common Mode Rejection Ratio LMV841 84 112
0V ≤ V
CM
≤ 3.3V dB
80
CMRR
Common Mode Rejection Ratio LMV842 77 106
0V ≤ V
CM
≤ 3.3V dB
and LMV844 75
86 108
PSRR Power Supply Rejection Ratio 2.7V ≤ V
+
≤ 12V, V
O
= V
+
/2 dB
82
CMVR Input Common-Mode Voltage Range CMRR ≥ 50 dB –0.1 3.4 V
R
L
= 2 kΩ 100 123
dB
V
O
= 0.3V to 3.0V 96
A
VOL
Large Signal Voltage Gain
R
L
= 10 kΩ 100 131
dB
V
O
= 0.2V to 3.1V 96
52 80
R
L
= 2 kΩ to V
+
/2 mV
120
Output Swing High,
(measured from V
+
)
28 50
R
L
= 10 kΩ to V
+
/2 mV
70
V
O
65 100
R
L
= 2 kΩ to V
+
/2 mV
120
Output Swing Low,
(measured from V
−
)
33 65
R
L
= 10 kΩ to V
+
/2 mV
75
(1) Electrical table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device.
(2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are guaranteed through correlations using
statistical quality control (SQC) method.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not guaranteed on
shipped production material.
(4) This parameter is guaranteed by design and/or characterization and is not tested in production.
(5) Positive current corresponds to current flowing into the device.
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