Datasheet

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ABSOLUTE MAXIMUM RATINGS
(1)
TPS3103xxx
TPS3106xxx
TPS3110xxx
SLVS363E AUGUST 2001 REVISED SEPTEMBER 2007
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION
(1)
PRODUCT NOMINAL SUPPLY VOLTAGE THRESHOLD VOLTAGE, V
IT
(2)
TPS3103E12DBVR 1.2 V 1.142 V
TPS3103E15DBVR 1.5 V 1.434 V
TPS3103H20DBVR 2.0 V 1.84 V
TPS3103K33DBVR 3.3 V 2.941 V
TPS3106E09DBVR 0.9 V 0.86 V
TPS3106E16DBVR 1.6 V 1.521 V
TPS3106K33DBVR 3.3 V 2.941 V
TPS3110E09DBVR 0.9 V 0.86 V
TPS3110E12DBVR 1.2 V 1.142 V
TPS3110E15DBVR 1.5 V 1.434 V
TPS3110K33DBVR 3.3 V 2.941 V
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com .
(2) Custom threshold voltages are available. Minimum order quantities apply. Contact factory for details and availability.
AVAILABLE OPTIONS
DEVICE RESET OUTPUT RSTSENSE, RSTVDD OUTPUT SENSE INPUT WDI INPUT PFO OUTPUT
TPS3103 Open-drain Open-drain
TPS3106 Open-drain ü
TPS3110 Push-pull ü ü
Over operating free-air temperature range, unless otherwise noted.
VALUE UNIT
Supply voltage, V
DD
(2)
0.3 to +3.6 V
MR Pin, V
MR
0.3 to V
DD
+ 0.3 V
All other pins
(2)
0.3 to +3.6 V
Maximum low output current, I
OL
5 mA
Maximum high output current, I
OH
5 mA
Input clamp current, I
IK
(V
I
< 0 or V
I
> V
DD
) ± 10 mA
Output clamp current, I
OK
(V
O
< 0 or V
O
> V
DD
)
(3)
± 10 mA
Continuous total power dissipation See Dissipation Rating Table
Operating temperature range, T
A
40 to +85 ° C
Storage temperature range, T
STG
65 to +150 ° C
Soldering temperature +260 ° C
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to GND. For reliable operation, the device must not be operated at 3.6 V for more than t = 1000h
continuously.
(3) Output is clamped for push-pull outputs by the back gate diodes internal to the IC. No clamp exists for the open-drain outputs.
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