Datasheet

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   
SLCS016A − SEPTEMBER 1985 − REVISED SEPTEMBER 2002
7
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
Response time is defined as the interval between the application of an input step function and the instant when the
output reaches 50% of its maximum value. Response time, low-to-high-level output, is measured from the leading
edge of the input pulse, while response time, high-to-low level output, is measured from the trailing edge of the input
pulse. Response-time measurement at low input signal levels can be greatly affected by the input offset voltage. The
offset voltage should be balanced by the adjustment at the inverting input (as shown in Figure 3) so that the circuit
is just at the transition point. Then a low signal, for example 105-mV or 5-mV overdrive, causes the output to change
state.
10%
50%
50 %
Pulse Generator
V
DD
10 Ω
10 Turn
1 V
−1 V
1 kΩ
0.1 mF
C
L
(see Note A)
1 µF5.1 kΩ
50 Ω
Input
Offset Voltage
Compensation
Adjustment
TEST CIRCUIT
t
PLH
90%
10%
t
PHL
t
f
t
r
90%
Input
Overdrive
Overdrive
Input
Low-to-High-
Level Output
High-to-Low-
Level Output
100 mV
100 mV
VOLTAGE WAVEFORMS
DUT
NOTE A: C
L
includes probe and jig capacitance.
Figure 3. Response, Rise, and Fall Times Circuit and Voltage Waveforms