Datasheet
SLOS154B− DECEMBER 1995 − REVISED JUNE 2005
11
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TYPICAL CHARACTERISTICS
†
Figure 1
−5
0
Percentage of Units − %
V
IO
− Input Offset Voltage − mV
5
70
−4 −3 −2 −1 0 1 2 3 4
10
20
30
40
50
60
DISTRIBUTION OF TLC27L1
INPUT OFFSET VOLTAGE
V
DD
= 5 V
T
A
= 25°C
P Package
905 Amplifiers Tested From 6 Wafer Lots
Figure 2
60
50
40
30
20
10
43210−1−2−3−4
70
5
V
IO
− Input Offset Voltage − mV
Percentage of Units − %
0
−5
DISTRIBUTION OF TLC27L1
INPUT OFFSET VOLTAGE
P Package
T
A
= 25°C
V
DD
= 10 V
905 Amplifiers Tested From 6 Wafer Lots
Figure 3
60
50
40
30
20
10
86420−2−4−6−8
70
10
Percentage of Units − %
0
−10
DISTRIBUTION OF TLC27L1
INPUT OFFSET VOLTAGE
TEMPERATURE COEFFICIENT
α
VIO
− Temperature Coefficient − µV/°C
(1) 12.1 µV/°C
(1) 19.2 µV/°C
Outliers:
P Package
T
A
= 25°C to 125°C
V
DD
= 5 V
356 Amplifiers Tested From 8 Wafer Lots
Figure 4
−10
0
Percentage of Units − %
α
VIO
− Temperature Coefficient − µV/°C
10
70
−8 −6 −4 −2 0 2 4 6 8
10
20
30
40
50
60
DISTRIBUTION OF TLC27L1
INPUT OFFSET VOLTAGE
TEMPERATURE COEFFICIENT
356 Amplifiers Tested From 8 Wafer Lots
V
DD
= 10 V
P Package
Outliers:
(1) 18.7 µV/°C
(1) 11.6 µV/°C
T
A
= 25°C to 125°C
†
Data at high and low temperatures are applicable only within the rated operating free-air temperature ranges of the various devices.