Datasheet
SLOS092D − SEPTEMBER 1987 − REVISED MARCH 2001
21
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TYPICAL CHARACTERISTICS
Figure 6
−5
0
Percentage of Units − %
V
IO
− Input Offset Voltage − mV
5
60
−4 −3 −2 −1 0 1 2 34
10
20
30
40
50
T
A
= 25°C
N Package
DISTRIBUTION OF TLC274
INPUT OFFSET VOLTAGE
753 Amplifiers Tested From 6 Wafer Lots
V
DD
= 5 V
Figure 7
50
40
30
20
10
43210−1−2−3−4
60
5
V
IO
− Input Offset Voltage − mV
Percentage of Units − %
0
−5
N Package
T
A
= 25°C
V
DD
= 10 V
DISTRIBUTION OF TLC274
INPUT OFFSET VOLTAGE
753 Amplifiers Tested From 6 Wafer Lots
Figure 8
50
40
30
20
10
86420−2−4−6−8
60
10
α
VIO
− Temperature Coefficient − µV/°C
Percentage of Units − %
0
−10
N Package
T
A
= 25°C to 125°C
324 Amplifiers Tested From 8 Wafer Lots
Outliers:
(1) 20.5 V/°C
DISTRIBUTION OF TLC274 AND TLC279
INPUT OFFSET VOLTAGE
TEMPERATURE COEFFICIENT
V
DD
= 5 V
Figure 9
−10
0
Percentage of Units − %
α
VIO
− Temperature Coefficient − µV/°C
10
60
−8 −6 −4 −2 0 2 4 6 8
10
20
30
40
50
Outliers:
T
A
= 25°C to 125°C
N Package
(1) 21.2 V/C
DISTRIBUTION OF TLC274 AND TLC279
INPUT OFFSET VOLTAGE
TEMPERATURE COEFFICIENT
324 Amplifiers Tested From 8 Wafer Lots
V
DD
= 10 V