Datasheet

  
  
SLVS017R − SEPTEMBER 1987 − REVISED AUGUST 2003
5
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
electrical characteristics, V
I
= 14 V, I
O
= 10 mA, T
J
= 25°C (unless otherwise noted)
PARAMETER
TEST CONDITIONS
TL750L10
TL751L10
UNIT
PARAMETER
TEST CONDITIONS
MIN TYP MAX
UNIT
Output voltage
V
I
= 11 V to 26 V,
I
O
= 0 to 150 mA
T
J
= 25°C 9.6 10 10.4
V
Output voltage V
I
= 11 V to 26 V, I
O
= 0 to 150 mA
T
J
= 0°C to 125°C
9.5 10.5
V
Input regulation voltage
V
I
= 12 V to 19 V 10 25
mV
Input regulation voltage
V
I
= 11 V to 26 V 30 60
mV
Ripple rejection V
I
= 12 V to 22 V, f = 120 Hz 60 65 dB
Output regulation voltage I
O
= 5 mA to 150 mA 50 100 mV
Dropout voltage
I
O
= 10 mA 0.2
V
Dropout voltage
I
O
= 150 mA 0.6
V
Output noise voltage f = 10 Hz to 100 kHz 700 µV
I
O
= 150 mA 10 12
Input bias current
V
I
= 11 V to 26 V, I
O
= 10 mA, T
J
= 0°C to 125°C 1 2
mA
Input bias current
ENABLE > 2 V
0.5
mA
Pulse-testing techniques are used to maintain the junction temperature as close to the ambient temperature as possible. Thermal effects must
be taken into account separately. All characteristics are measured with a 0.1-µF capacitor across the input and a 10-µF capacitor, with equivalent
series resistance of less than 0.4 , across the output.
electrical characteristics, V
I
= 14 V, I
O
= 10 mA, T
J
= 25°C (unless otherwise noted)
PARAMETER
TEST CONDITIONS
TL750L12
TL751L12
UNIT
PARAMETER
TEST CONDITIONS
MIN TYP MAX
UNIT
Output voltage
V
I
= 13 V to 26 V,
I
O
= 0 to 150 mA
T
J
= 25°C 11.52 12 12.48
V
Output voltage V
I
= 13 V to 26 V
,
I
O
= 0 to 150 mA
T
J
= 0°C to 125°C
11.4 12.6
V
Input regulation voltage
V
I
= 14 V to 19 V 15 30
mV
Input regulation voltage
V
I
= 13 V to 26 V 20 40
mV
Ripple rejection V
I
= 13 V to 23 V, f = 120 Hz 50 55 dB
Output regulation voltage I
O
= 5 mA to 150 mA 50 120 mV
Dropout voltage
I
O
= 10 mA 0.2
V
Dropout voltage
I
O
= 150 mA 0.6
V
Output noise voltage f = 10 Hz to 100 kHz 700 µV
I
O
= 150 mA 10 12
Input bias current
V
I
= 13 V to 26 V, I
O
= 10 mA, T
J
= 0°C to 125°C 1 2
mA
Input bias current
ENABLE > 2 V
0.5
mA
Pulse-testing techniques are used to maintain the junction temperature as close to the ambient temperature as possible. Thermal effects must
be taken into account separately. All characteristics are measured with a 0.1-µF capacitor across the input and a 10-µF capacitor, with equivalent
series resistance of less than 0.4 , across the output.