Datasheet

THS4521
THS4522
THS4524
SBOS458F DECEMBER 2008REVISED SEPTEMBER 2011
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PACKAGE/ORDERING INFORMATION
(1)
SPECIFIED
PACKAGE- PACKAGE TEMPERATURE PACKAGE ORDERING TRANSPORT MEDIA,
PRODUCT LEAD DESIGNATOR RANGE MARKING NUMBER QUANTITY
THS4521ID Rails, 75
SOIC-8 D TH4521
THS4521IDR Tape and reel, 2500
THS4521 40°C to +85°C
THS4521IDGKT Tape and reel, 250
MSOP-8 DGK 4521
THS4521IDGKR Tape and reel, 2500
THS4522IPW Rails, 90
THS4522 TSSOP-16 PW 40°C to +85°C THS4522
THS4522IPWR Tape and reel, 2000
THS4524IDBT Rails, 50
THS4524 TSSOP-38 DBT 40°C to +85°C THS4524
THS4524IDBTR Tape and reel, 2000
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the
relevant product folders at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range (unless otherwise noted).
THS4521, THS4522. THS4524 UNIT
Supply Voltage, V
S
to V
S+
5.5 V
Input/Output Voltage, V
I
(V
IN±
, V
OUT±
, V
OCM
pins) (V
S
) 0.7 to (V
S+
) + 0.7V V
Differential Input Voltage, V
ID
1 V
Output Current, I
O
100 mA
Input Current, I
I
(V
IN±
, V
OCM
pins) 10 mA
Continuous Power Dissipation See Thermal Characteristic Specifications
Maximum Junction Temperature, T
J
+150 °C
Maximum Junction Temperature, T
J
(continuous operation, long-term reliability) +125 °C
Operating Free-air Temperature Range, T
A
40 to +85 °C
Storage Temperature Range, T
STG
65 to +150 °C
Human Body Model (HBM) 1300 V
ESD
Charge Device Model (CDM) 1000 V
Rating:
Machine Model (MM) 50 V
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2 Submit Documentation Feedback Copyright © 20082011, Texas Instruments Incorporated
Product Folder Link(s): THS4521 THS4522 THS4524