Datasheet
www.ti.com
FEATURES APPLICATIONS
DESCRIPTION
_
+
THS4303
R
f
49.9 Ω
V
I
+
22 µF 47 pF 0.1 µF
V
S+
50 Ω Source
R
g
V
O
+ 22 µF 47 pF 0.1 µF
V
S−
30.1 Ω
30.1 Ω
FB
FB
FB = Ferrite Bead
10
12
14
16
18
20
22
100 k 1 M 10 M 100 M 1 G 10 G
f − Frequency − Hz
SMALL SIGNAL FREQUENCY RESPONSE
R
L
= 100 Ω
V
O
= 100 mV
PP
V
S
= 5 V
Small Signal Gain − dBSmall Signal Gain − dB
49.9 Ω
50 Ω Load
THS4303
SLOS421B – NOVEMBER 2003 – REVISED JANUARY 2005
WIDEBAND FIXED-GAIN AMPLIFIER
• Wideband Signal Processing
• Fixed Closed-Loop Gain Amplifier
• Wireless Transceivers
– 10 V/V (20 dB)
• IF Amplifier
• Wide Bandwidth: 1.8 GHz
• ADC Preamplifier
• High Slew Rate: 5500 V/µs
• DAC Output Buffers
• Low Total Input Referred Noise: 2.5 nV/ √ Hz
• Test, Measurement, and Instrumentation
• Low Distortion
• Medical and Industrial Imaging
– HD
2
: –65 dBc at 70 MHz
– HD
3
: –76 dBc at 70 MHz
– IMD
3
: –85 dBc at 100 MHz
The THS4303 device is a wideband, fixed-gain ampli-
– OIP
3
: 34 dBm at 100 MHz
fier that offers high bandwidth, high slew rate, low
noise, and low distortion. This combination of specifi-
– IMD
3
: –70 dBc at 300 MHz
cations enables analog designers to transcend cur-
– OIP
3
: 27 dBm at 300 MHz
rent performance limitations and process analog sig-
• High Output Drive: ± 180 mA
nals at much higher speeds than previously possible
with closed-loop, complementary amplifier designs.
• Power Supply Voltage: 3 V or 5 V
The devices are offered in a 16-pin leadless package
and incorporate a power-down mode for quiescent
power savings.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PowerPAD is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Copyright © 2003–2005, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.