Datasheet

t
c
NOTE A: The worst-case test pattern produces the maximum switching frequency for all of the outputs.
CLKOUT
EVEN Dn
ODD Dn
Dn
t
su2
CLKOUT
t
h2
70% V
OH
70% V
OH
30% V
OH
30% V
OH
SN75LVDS82
www.ti.com SLLS259I –NOVEMBER 1996– REVISED APRIL 2011
PARAMETER MEASUREMENT INFORMATION (continued)
Figure 5. Worst-Case Test-Pattern Waveforms
Figure 6. Setup and Hold Time Waveforms
Copyright © 1996–2011, Texas Instruments Incorporated 7