Datasheet

SN54ACT244, SN74ACT244
OCTAL BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCAS517C − JUNE 1995 − REVISED OCTOBER 2002
3
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
recommended operating conditions (see Note 3)
SN54ACT244 SN74ACT244
UNIT
MIN MAX MIN MAX
UNIT
V
CC
Supply voltage 4.5 5.5 4.5 5.5 V
V
IH
High-level input voltage 2 2 V
V
IL
Low-level input voltage 0.8 0.8 V
V
I
Input voltage 0 V
CC
0 V
CC
V
V
O
Output voltage 0 V
CC
0 V
CC
V
I
OH
High-level output current −24 −24 mA
I
OL
Low-level output current 24 24 mA
Δt/Δv Input transition rise or fall rate 8 8 ns/V
T
A
Operating free-air temperature −55 125 −40 85 °C
NOTE 3: All unused inputs of the device must be held at V
CC
or GND to ensure proper device operation. Refer to the TI application report,
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
V
T
A
= 25°C SN54ACT244 SN74ACT244
UNIT
PARAMETER TEST CONDITIONS V
CC
MIN TYP MAX MIN MAX MIN MAX
UNIT
I 50 A
4.5 V 4.4 4.49 4.4 4.4
I
OH
= −50 μA
5.5 V 5.4 5.49 5.4 5.4
V
I 24 A
4.5 V 3.86 3.7 3.76
V
V
OH
I
OH
= −24 mA
5.5 V 4.86 4.7 4.76
V
I
OH
= −50 mA
†
5.5 V 3.85
I
OH
= −75 mA
†
5.5 V 3.85
I 50 A
4.5 V 0.001 0.1 0.1 0.1
I
OL
= 50 μA
5.5 V 0.001 0.1 0.1 0.1
V
I 24 mA
4.5 V 0.36 0.5 0.44
V
V
OL
I
OL
= 24 mA
5.5 V 0.36 0.5 0.44
V
I
OL
= 50 mA
†
5.5 V 1.65
I
OL
= 75 mA
†
5.5 V 1.65
I
OZ
V
O
= V
CC
or GND 5.5 V ±0.25 ±5 ±2.5 μA
I
I
V
I
= V
CC
or GND 5.5 V ±0.1 ±1 ±1 μA
I
CC
V
I
= V
CC
or GND, I
O
= 0 5.5 V 4 80 40 μA
ΔI
CC
‡
One input at 3.4 V,
Other inputs at GND or V
CC
5.5 V 0.6 1.6 1.5 mA
C
i
V
I
= V
CC
or GND 5 V 2.5 pF
C
o
V
I
= V
CC
or GND 5 V 8 pF
†
Not more than one output should be tested at a time, and the duration of the test should not exceed 2 ms.
‡
This is the increase in supply current for each input that is at one of the specified TTL voltage levels, rather than 0 V or V
CC
.