Datasheet

SN54ABT8543, SN74ABT8543
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS120E – AUGUST 1991 – REVISED JULY 1996
21
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (normal mode) (see Figure 13)
SN54ABT8543 SN74ABT8543
UNIT
MIN MAX MIN MAX
UNIT
t
w
Pulse duration LEAB or LEBA high or low 3 3 ns
t
su
Setup time A before LEAB↑ or B before LEBA↑ 3.5 3 ns
t
h
Hold time A after LEAB↑ or B after LEBA↑ 1.5 0.5 ns
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (test mode) (see Figure 13)
SN54ABT8543 SN74ABT8543
UNIT
MIN MAX MIN MAX
UNIT
f
clock
Clock frequency TCK 0 50 0 50 MHz
t
w
Pulse duration TCK high or low 5 5 ns
A or B or CE or LE or OE before TCK↑ 6 5
t
su
Setup time
TDI before TCK↑
6.5 6
ns
TMS before TCK↑ 6 6
A or B or CE or LE or OE after TCK↑ 0.5 0
t
h
Hold time
TDI after TCK↑
0 0
ns
TMS after TCK↑ 0 0
t
d
Delay time Power up to TCK↑ 50* 50 ns
t
r
Rise time V
CC
power up 1* 1 µs
* On products compliant to MIL-PRF-38535, this parameter is not production tested.