Datasheet

R
D
B
A
Z
Y
7
8
6
5
2
3
DP (TOP VIEW)ACKAGE
1
2
3
4
8
7
6
5
R
D
V
CC
B
A
Z
Y
GND
1
2
3
4
5
6
7
14
13
12
11
10
9
8
NC
R
RE
DE
D
GND
GND
V
CC
V
CC
A
B
Z
Y
NC
NC-Nointernalconnection
Pins6and7areconnectedtogetherinternally
Pins13and14areconnectedtogetherinternally
1
2
3
4
5
6
7
8
9
10 11
19
18
17
16
15
14
13
12
20
V
CC
V
CC
R
RE
DE
D
GND GND
Y
Z
A
B
NC
NC
NC
NC
NC
NC
NC
NC
NC-Nointernalconnection
Pins10and11areconnectedtogetherinternally
Pins1and20areconnectedtogetherinternally
RHL PACKAGE(TOP VIEW)
18
17
A
B
14
15
Y
Z
3
4
6
7
R
RE
DE
D
SN65HVD30 – SN65HVD35
SLLS665I –SEPTEMBER 2005–REVISED APRIL 2010 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
SN65HVD30, SN65HVD31, SN65HVD32 SN65HVD33, SN65HVD34, SN65HVD35
SN65HVD33
2 Submit Documentation Feedback Copyright © 2005–2010, Texas Instruments Incorporated
Product Folder Link(s) :SN65HVD30 – SN65HVD35