Datasheet

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Testability
IDDQ Function
Local Loopback
SLK2721
SLLS532B – JUNE 2002 – REVISED MARCH 2007
The SLK2721 device has a comprehensive suite of built-in self-tests. The loopback function provides for
at-speed testing of the transmit/receive portions of the circuitry. The ENABLE pin allows for all circuitry to be
disabled so that an IDDQ test can be performed. The PRBS function allows for a built-in self-test (BIST).c
When held low, the ENABLE pin disables all quiescent power in both the analog and digital circuitry. This allows
for IDDQ testing on all power supplies and can also be used to conserve power when the link is inactive.
The LLOOP signal pin controls the local loopback. When LLOOP is high, the loopback mode is activated and
the parallel transmit data is selected and presented on the parallel receive data output pins. The parallel transmit
data is also multiplexed and presented on the high-speed serial transmit pins. Local loopback can only be
enabled under transceiver mode.
Figure 3. Local Loopback Data Path
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