Datasheet

PCM5100, PCM5101, PCM5102

www.ti.com

SLAS764B –MAY 2011–REVISED SEPTEMBER 2012

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

DEVICE INFORMATION

TERMINAL FUNCTIONS, PCM510x

PCM510x (top view)

Table 2. TERMINAL FUNCTIONS, PCM510x

TERMINAL

I/O DESCRIPTION

NAME NO.

CPVDD 1 — Charge pump power supply, 3.3V

CAPP 2 O Charge pump flying capacitor terminal for positive rail

CPGND 3 — Charge pump ground

CAPM 4 O Charge pump flying capacitor terminal for negative rail

VNEG 5 O Negative charge pump rail terminal for decoupling, -3.3V

OUTL 6 O Analog output from DAC left channel

OUTR 7 O Analog output from DAC right channel

AVDD 8 -— Analog power supply, 3.3V

AGND 9 — Analog ground

DEMP 10 I De-emphasis control for 44.1kHz sampling rate

(1)

: Off (Low) / On (High)

FLT 11 I Filter select : Normal latency (Low) / Low latency (High)

SCK 12 I System clock input

(1)

BCK 13 I Audio data bit clock input

(1)

DIN 14 I Audio data input

(1)

LRCK 15 I Audio data word clock input

(1)

FMT 16 I Audio format selection : I

S (Low) / Left justified (High)

XSMT 17 I Soft mute control

(1)

: Soft mute (Low) / soft un-mute (High)

LDOO 18 — Internal logic supply rail terminal for decoupling

DGND 19 — Digital ground

DVDD 20 — Digital power supply, 3.3V

(1) Failsafe LVCMOS Schmitt trigger input

Product Folder Links: PCM5100 PCM5101 PCM5102