Datasheet

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SBOS282B − DECEMBER 2003 − REVISED FEBRUARY 2005
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3
ELECTRICAL CHARACTERISTICS: V
S
= ±5V (V
S
= +10V)
Boldface limits apply over the specified temperature range, T
A
= −40°C to +85°C.
At T
A
= +25°C, R
L
= 10kΩ connected to V
S
/2, and V
OUT
= V
S
/2, unless otherwise noted.
OPA734, OPA2734, OPA735, OPA2735
PARAMETER CONDITIONS MIN TYP MAX UNIT
OFFSET VOLTAGE
Input Offset Voltage V
OS
1 5 µV
vs Temperature dV
OS
/dT 0.01 0.05 µV/°C
vs Power Supply PSRR V
S
= 2.7V to 12V, V
CM
= 0V 0.2 1.8 µV/V
Long-Term Stability Note (1)
Channel Separation, dc 0.1 µV/V
INPUT BIAS CURRENT
Input Bias Current I
B
V
CM
= V
S
/2 ±100 ±200 pA
over Temperature See Typical Characteristics pA
Input Offset Current I
OS
V
CM
= V
S
/2 ±200 ±300 pA
NOISE
Input Voltage Noise, f = 0.01Hz to 1Hz e
n
0.8 µV
PP
Input Voltage Noise, f = 0.1Hz to 10Hz e
n
2.5 µV
PP
Input Voltage Noise Density, f = 1kHz e
n
135 nV/√Hz
Input Current Noise Density, f = 1kHz i
n
40 fA/√Hz
INPUT VOLTAGE RANGE
Common-Mode Voltage Range V
CM
(V−) − 0.1 (V+) − 1.5 V
Common-Mode Rejection Ratio CMRR (V−) − 0.1V < V
CM
< (V+) − 1.5V 115 130 dB
INPUT CAPACITANCE
Differential 2 pF
Common-Mode 10 pF
OPEN-LOOP GAIN
Open-Loop Voltage Gain A
OL
(V−) + 100mV < V
O
< (V+) − 100mV 115 130 dB
FREQUENCY RESPONSE
Gain-Bandwidth Product GBW 1.6 MHz
Slew Rate SR G = +1 1.5 V/µs
OUTPUT
Voltage Output Swing from Rail R
L
= 10kΩ 20 50 mV
Short-Circuit Current I
SC
±20 mA
Open-Loop Output Impedance f = 1MHz, I
O
= 0 125 Ω
Capacitive Load Drive C
LOAD
See Typical Characteristics
ENABLE/SHUTDOWN
t
OFF
1.5 µs
t
ON
(2)
150 µs
V
L
(amplifier is shutdown) V− (V−) + 0.8 V
V
H
(amplifier is active) (V−) + 2 V+ V
I
QSD
(per amplifier) 4 9 µA
Input Bias Current of Enable Pin 3 µA
POWER SUPPLY
Operating Voltage Range V
S
2.7 to 12
(±1.35 to ±6)
V
Quiescent Current (per amplifier) I
Q
I
O
= 0 0.6 0.75 mA
TEMPERATURE RANGE
Specified Range −40 +85 °C
Operating Range −40 +150 °C
Storage Range −65 +150 °C
Thermal Resistance q
JA
°C/W
SOT23-5, SOT23-6 200 °C/W
MSOP-8, MSOP-10, SO-8 150 °C/W
(1)
300-hour life test at 150°C demonstrated randomly distributed variation in the range of measurement limits—approximately 1µV.
(2)
Device requires one complete auto-zero cycle to return to V
OS
accuracy.