Datasheet
LMV761, LMV762
SNOS998H –FEBRUARY 2002–REVISED MARCH 2013
www.ti.com
2.7V Electrical Characteristics
Unless otherwise specified, all limited ensured for T
J
= 25°C, V
CM
= V
+
/2, V
+
= 2.7V, V
−
= 0V
−
. Boldface limits apply at the
temperature extremes.
(1)
Symbol Parameter Condition Min
(2)
Typ
(3)
Max
(2)
Units
V
OS
Input Offset Voltage 0.2 1.0 mV
I
B
Input Bias Current
(4)
0.2 50 pA
I
OS
Input Offset Current
(4)
.001 5 pA
CMRR Common Mode Rejection Ratio 0V < V
CM
< V
CC
- 1.3V 80 100 dB
PSRR Power Supply Rejection Ratio V
+
= 2.7V to 5V 80 110 dB
Input Common Mode Voltage −0.3
CMVR CMRR > 50dB V
Range 1.5
Output Swing High I
L
= 2mA, V
ID
= 200mV V
+
– 0.35 V
+
– 0.1 V
V
O
Output Swing Low I
L
= −2mA, V
ID
= −200mV 90 250 mV
Sourcing, V
O
= 1.35V, V
ID
= 200mV 6.0 20
I
SC
Output Short Circuit Current
(5)
mA
Sinking, V
O
= 1.35V, V
ID
= −200mV 6.0 15
Supply Current LMV761 (Single
275 700 μA
Comparator)
I
S
LMV762/LMV762Q (Both
550 1400 μA
Comparators)
I
OUT
Output Leakage I @ Shutdown SD = GND, V
O
= 2.7V 0.20 μA
LEAKAGE
I
S LEAKAGE
Supply Leakage I @ Shutdown SD = GND, V
CC
= 2.7V 0.20 2 μA
Propagation Delay Overdrive = 5mV 270
R
L
= 5.1kΩ
t
PD
Overdrive = 10mV 205 ns
C
L
= 50pF
Overdrive = 50mV 120
t
SKEW
Propagation Delay Skew 5 ns
t
r
Output Rise Time 10% to 90% 1.7 ns
t
f
Output Fall Time 90% to 10% 1.8 ns
t
on
Turn On Time from Shutdown 6 μs
(1) Maximum temperature ensured range is −40°C to 125°C.
(2) All limits are specified by testing or statistical analysis.
(3) Typical values represent the most likely parametric norm.
(4) Specified by design.
(5) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T
J
= T
A
. No ensured specification of parametric performance is indicated in the electrical
tables under conditions of internal self-heating where T
J
> T
A
. See Application Information for information on temperature de-rating of
this device. Absolute Maximum Rating indicate junction temperature limits beyond which the device may be permanently degraded,
either mechanically or electrically.
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