Datasheet

LM7905, LM7912, LM7915
SNOSBQ7C –JUNE 1999–REVISED MAY 2013 www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
ABSOLUTE MAXIMUM RATINGS
(1)
Input Voltage
(V
o
= −5V) −25V
(V
o
= −12V and −15V) −35V
Input-Output Differential
(V
o
= −5V) 25V
(V
o
= −12V and −15V) 30V
Power Dissipation
(2)
Internally Limited
Operating Junction Temperature Range 0°C to +125°C
Storage Temperature Range −65°C to +150°C
Lead Temperature (Soldering, 10 sec.) 230°C
(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is intended to be functional, but do not ensure Specific Performance limits. For ensured specifications and test
conditions, see the Electrical Characteristics.
(2) Refer to DESIGN CONSIDERATIONS for details.
ELECTRICAL CHARACTERISTICS
Conditions unless otherwise noted: I
OUT
= 500mA, C
IN
= 2.2μF, C
OUT
= 1μF, 0°C ≤ T
J
≤ +125°C, Power Dissipation ≤ 1.5W.
Part Number LM7905C Units
Output Voltage −5V
Input Voltage (unless otherwise specified) −10V
Symbol Parameter Conditions Min Typ Max
V
O
Output Voltage T
J
= 25°C −4.8 −5.0 −5.2 V
5mA ≤ I
OUT
≤ 1A, −4.75 −5.25 V
P ≤ 15W (−20 ≤ V
IN
≤ −7) V
ΔV
O
Line Regulation T
J
= 25°C,
(1)
8 50 mV
(−25 ≤ V
IN
≤ −7) V
2 15 mV
(−12 ≤ V
IN
≤ −8) V
ΔV
O
Load Regulation T
J
= 25°C,
(1)
5mA ≤ I
OUT
≤ 1.5A 15 100 mV
250mA ≤ I
OUT
≤ 750mA 5 50 mV
I
Q
Quiescent Current T
J
= 25°C 1 2 mA
ΔI
Q
Quiescent Current With Line 0.5 mA
Change (−25 ≤ V
IN
≤ −7) V
With Load, 5mA ≤ I
OUT
≤ 1A 0.5 mA
V
n
Output Noise Voltage T
A
= 25°C, 10Hz ≤ f ≤ 100Hz 125 μV
Ripple Rejection f = 120Hz 54 66 dB
(−18 ≤ V
IN
≤ −8) V
Dropout Voltage T
J
= 25°C, I
OUT
= 1A 1.1 V
I
OMAX
Peak Output Current T
J
= 25°C 2.2 A
Average Temperature I
OUT
= 5mA, 0.4 mV/°C
Coefficient of 0 C ≤ T
J
≤ 100°C
Output Voltage
(1) Regulation is measured at a constant junction temperature by pulse testing with a low duty cycle. Changes in output voltage due to
heating effects must be taken into account.
2 Submit Documentation Feedback Copyright © 1999–2013, Texas Instruments Incorporated
Product Folder Links: LM7905 LM7912 LM7915