Datasheet

LM5018
SNVS787E JANUARY 2012REVISED DECEMBER 2013
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Electrical Characteristics
Specifications with standard typeface are for T
J
= 25°C, and those with boldface type apply over full Operating Junction
Temperature range. V
IN
= 48 V, unless otherwise stated. See
(1)
.
Symbol Parameter Conditions Min Typ Max Units
V
CC
Supply
V
CC
Reg V
CC
Regulator Output V
IN
= 48 V, I
CC
= 20 mA 6.25 7.6 8.55 V
V
CC
Current Limit V
IN
= 48 V
(2)
26 mA
V
CC
Undervoltage Lockout Voltage 4.15 4.5 4.9 V
(V
CC
Increasing)
V
CC
Undervoltage Hysteresis 300 mV
V
CC
Drop Out Voltage V
IN
= 9 V, I
CC
= 20 mA 2.3 V
I
IN
Operating Current Non-Switching, FB = 3 V 1.75 mA
I
IN
Shutdown Current UVLO = 0 V 50 225 µA
Switch Characteristics
Buck Switch R
DS(ON)
I
TEST
= 200 mA, BST-SW = 7 0.8 1.8
V
Synchronous R
DS(ON)
I
TEST
= 200 mA 0.45 1
Gate Drive UVLO V
BST
V
SW
Rising 2.4 3 3.6 V
Gate Drive UVLO Hysteresis 260 mV
Current Limit
Current Limit Threshold 390 575 750 mA
Current Limit Response Time Time to Switch Off 150 ns
Off-Time Generator (Test 1) FB = 0.1 V, V
IN
= 48 V 12 µs
Off-Time Generator (Test 2) FB = 1 V, V
IN
= 48 V 2.5 µs
On-Time Generator
T
ON
Test 1 V
IN
= 32 V, R
ON
= 100 k 270 350 460 ns
T
ON
Test 2 V
IN
= 48 V, R
ON
= 100 k 188 250 336 ns
T
ON
Test 3 V
IN
= 75 V, R
ON
= 250 k 250 370 500 ns
T
ON
Test 4 V
IN
= 10 V, R
ON
= 250 k 1880 3200 4425 ns
Minimum Off-Time
Minimum Off-Timer FB = 0 V 144 ns
Regulation and Overvoltage Comparators
FB Regulation Level Internal reference trip point 1.2 1.225 1.25 V
for switch ON
FB Overvoltage Threshold Trip point for switch OFF 1.62 V
FB Bias Current 60 nA
Undervoltage Sensing Function
UV Threshold UV Rising 1.19 1.225 1.26 V
UV Hysteresis Input Current UV = 2.5 V -10 -20 –29 µA
Remote Shutdown Threshold Voltage at UVLO Falling 0.32 0.66 V
Remote Shutdown Hysteresis 110 mV
Thermal Shutdown
Tsd Thermal Shutdown Temp. 165 °C
Thermal Shutdown Hysteresis 20 °C
Thermal Resistance
Junction to Ambient SO PowerPAD-8 40 °C/W
θ
JA
WSON-8 40 °C/W
(1) All limits are verified by design. All electrical characteristics having room temperature limits are tested during production at T
A
= 25°C. All
hot and cold limits are verified by correlating the electrical characteristics to process and temperature variations and applying statistical
process control.
(2) V
CC
provides self bias for the internal gate drive and control circuits. Device thermal limitations limit external loading.
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