Datasheet

LM2597, LM2597HV
www.ti.com SNVS119C –MARCH 1998–REVISED APRIL 2013
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
Absolute Maximum Ratings
(1)(2)
Maximum Supply Voltage (V
IN
)
(3)
LM2597 45V
LM2597HV 60V
SD /SS Pin Input Voltage
(4)
6V
Delay Pin Voltage
(4)
1.5V
Flag Pin Voltage −0.3 ≤ V ≤45V
Bias Supply Voltage (V
BS
) −0.3 ≤ V ≤30V
Feedback Pin Voltage −0.3 ≤ V ≤+25V
Output Voltage to Ground (Steady State) −1V
Power Dissipation Internally limited
Storage Temperature Range −65°C to +150°C
ESD Susceptibility
Human Body Model
(5)
2 kV
Lead Temperature D8 Package Vapor Phase (60 sec.) +215°C
Infrared (15 sec.) +220°C
P Package (Soldering, 10 sec.) +260°C
Maximum Junction Temperature +150°C
(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is intended to be functional, but do not ensure specific performance limits. For specifications and test conditions, see
the Electrical Characteristics.
(2) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and
specifications.
(3) V
IN
= 40V for the LM2597 and 60V for the LM2597HV.
(4) Voltage internally clamped. If clamp voltage is exceeded, limit current to a maximum of 1 mA.
(5) The human body model is a 100 pF capacitor discharged through a 1.5k resistor into each pin.
Operating Conditions
Temperature Range −40°C ≤ T
J
+125°C
Supply Voltage LM2597 4.5V to 40V
LM2597HV 4.5V to 60V
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