Datasheet

INA219
SBOS448F –AUGUST 2008– REVISED SEPTEMBER 2011 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
Table 1. PACKAGING INFORMATION
(1)
PRODUCT PACKAGE-LEAD PACKAGE DESIGNATOR PACKAGE MARKING
SO-8 D I219A
INA219A
SOT23-8 DCN A219
SO-8 D I219B
INA219B
SOT23-8 DCN B219
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or visit the
INA219 product folder at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range (unless otherwise noted).
INA219 UNIT
Supply Voltage, V
S
6 V
Differential (V
IN+
) – (V
IN–
)
(2)
–26 to +26 V
Analog Inputs,
V
IN+
, V
IN–
Common-Mode -0.3 to +26 V
SDA GND – 0.3 to +6 V
SCL GND – 0.3 to V
S
+ 0.3 V
Input Current Into Any Pin 5 mA
Open-Drain Digital Output Current 10 mA
Operating Temperature –40 to +125 °C
Storage Temperature –65 to +150 °C
Junction Temperature +150 °C
Human Body Model 4000 V
ESD Ratings Charged-Device Model 750 V
Machine Model (MM) 200 V
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
(2) V
IN+
and V
IN–
may have a differential voltage of –26V to +26V; however, the voltage at these pins must not exceed the range –0.3V to
+26V.
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Product Folder Link(s): INA219