Datasheet

CY74FCT16245
T
CY74FCT162245
T
CY74FCT162H245
T
3
Output Drive Characteristics for CY74FCT16245T
Parameter Description Test Conditions Min. Typ.
[5]
Max. Unit
V
OH
Output HIGH Voltage V
CC
=Min., I
OH
=–3 mA 2.5 3.5 V
V
CC
=Min., I
OH
=–15 mA 2.4 3.5 V
V
CC
=Min., I
OH
=–32 mA 2.0 3.0 V
V
OL
Output LOW Voltage V
CC
=Min., I
OL
=64 mA 0.2 0.55 V
Output Drive Characteristics for CY74FCT162245T, CY74FCT162H245T
Parameter Description Test Conditions Min. Typ.
[5]
Max. Unit
I
ODL
Output LOW Current
[8]
V
CC
=5V, V
IN
=V
IH
or V
IL
, V
OUT
=1.5V 60 115 150 mA
I
ODH
Output HIGH Current
[8]
V
CC
=5V, V
IN
=V
IH
or V
IL
, V
OUT
=1.5V –60 –115 –150 mA
V
OH
Output HIGH Voltage V
CC
=Min., I
OH
=–24 mA 2.4 3.3 V
V
OL
Output LOW Voltage V
CC
=Min., I
OL
=24 mA 0.3 0.55 V
Notes:
5. Typical values are at V
CC
=5.0V, T
A
=+25˚C ambient.
6. This parameter is specified but not tested.
7. Pins with bus hold are described in Pin Description.
8. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, I
OS
tests should be performed last.
9. Tested at +25˚C.
Capacitance
[6]
(T
A
= +25˚C, f = 1.0 MHz)
Parameter Description Test Conditions Typ.
[5]
Max. Unit
C
IN
Input Capacitance V
IN
= 0V 4.5 6.0 pF
C
OUT
Output Capacitance V
OUT
= 0V 5.5 8.0 pF