Datasheet

ADS1299
www.ti.com
SBAS499A JULY 2012REVISED AUGUST 2012
CONFIG2: Configuration Register 2
Address = 02h
BIT 7 BIT 6 BIT 5 BIT 4 BIT 3 BIT 2 BIT 1 BIT 0
1 1 0 INT_CAL 0 CAL_AMP0 CAL_FREQ1 CAL_FREQ0
This register configures the test signal generation. See the Input Multiplexer section for more details.
Bits[7:5] Must always be set to '110'
Bit 4 INT_CAL: TEST source
This bit determines the source for the Test signal.
0 = Test signals are driven externally (default)
1 = Test signals are generated internally
Bit 3 Must always be set to '0'
Bit 2 CAL_AMP0: Test signal amplitude
This bit determines the calibration signal amplitude.
0 = 1 × (VREFP – VREFN) / 2.4 mV (default)
1 = 2 × (VREFP – VREFN) / 2.4 mV
Bits[1:0] CAL_FREQ[1:0]: Test signal frequency
These bits determine the calibration signal frequency.
00 = Pulsed at f
CLK
/ 2
21
(default)
01 = Pulsed at f
CLK
/ 2
20
10 = Not used
11 = At dc
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