Datasheet

108-40000
Test Description Requirem ent Procedure
Tem perature life. Term ination resistance, dry circuit.
See Note (a).
TE Spec 109-43, Test Level 10,
Duration C.
Subject wired and mated
connectors to tem perature life.
(a) Shall remain mated and show no evidence of damage, cracking or chipping.
NOTE
(b) Shall show no evidence of damage, cracking or chipping.
(c) Unless limited by temperature rating of cable used.
(d) Shall show no evidence of damage, cracking or chipping.
Figure 1 (end)
3.6. Connector Tests and Sequence
Test or Exam ination
Test Group (a)
1 2 3 4 5
Test Sequence (b)
Exam ination of product 1,9 1,8 1,5 1,5 1,5
Term ination resistance, dry circuit 3,7 2,4 2,4 2,4
Insulation resistance 2,6
Dielectric withstanding voltage 3,7
Random vibration 5
Physical shock 6
Connector mating force 2
Connector unmating force 8
Durability 4
Therm al shock 4 3
Hum idity/tem perature cycling 5
Mixed flowing gas 3
Tem perature life 3
(a) See paragraph 4.1.A.
NOTE
(b) Numbers indicate sequence in which tests are performed.
Figure 2
Rev D 4 of 6