User guide

73S12xxF USB-CCID Host GUI Users Guide UG_12xxF_037
10 Rev. 1.1
Figure 6: EMV/ISO Mode Frame
It is recommended that the loop delay be set to at least 20 seconds. Teridian’s internal EMV Level I test
has shown better results with delay setting at 25 seconds. This is due to the long cycle of some tests and
especially the way Windows’ Resource Manager handles automatic retry activations of Smart Card. For
example, when a test might be wrapping up with test logs, if the delay is too short, the C# application
might be calling to activate a card for the next test. The response will be a Card Mute because the card
side is still wrapping up the last test. Windows Resource Manager will automatically make two more
retries to activate the Smart Card. These subsequent activation commands can cause the card to fail the
next test because the test is not anticipating them.
Caveat: There is a potential issue with the Windows Resource Manager if the EMV Level I test is run in a
particular case. When a test indicates a failure instead of returning a good ATR (this is to test the reader
handling of an error-ATR); if the
next
2.1.4.1 ISO and EMV Select Buttons
test has a good ATR and expects a Select File command to be sent,
this next test will fail. When there is an error return code from the device in response to any command,
the next successful activation (with a good ATR) will be followed immediately with a deactivation
command by Resource Manager. This deactivation disrupts the test sequence causing the test failure. If
this occurs, rerun the test making sure that the previous command prior to the rerun was a success. This
problem occurs whether the Teridian or the Microsoft CCID driver is used.
The ISO and EMV select buttons allow the user to select the compliant mode of the card session for the
selected slot. The interactions between the reader and card are different based on ISO-7816 or EMV
compatibility. The mode selection must be made prior to sending any APDU commands or initiation of
loopback testing.
2.1.4.2 EMV Level 1 Test Automation Button
Selecting the EMV Level 1 Test Automation button enables the EMV Level 1 Test Automation
sub-frame. Within this sub-frame are two more sub-frames that allow the selection of the specific EMV
tests and setup. The EMV test types are; MCI (Cetecom Lab), VISA-1 (RFI Global, FIME test labs) and
VISA-2 (ICT-K lab) and iteration selections; single or loopback. If the LoopBack button is selected, the
LoopBack Interval list box is enabled. This will configure the EMV test to repeat based on the interval
selected based in one-second increments. The default repeat time is 20 seconds, which is the minimal
recommended value. Based on our internal testing, 25 seconds is optimal for most labs.