Datasheet
© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 • 864-963-6300 • www.kemet.com C1003_C0G • 7/21/2016 12
Surface Mount Multilayer Ceramic Chip Capacitors (SMD MLCCs)
C0G Dielectric, 10 – 250 VDC (Commercial Grade)
Table 4 – Performance & Reliability: Test Methods and Conditions
Stress Reference Test or Inspection Method
TerminalStrength JIS–C–6429 Appendix1,Note:Forceof1.8kgfor60seconds.
BoardFlex JIS–C–6429
Appendix2,Note:Standardterminationsystem–2.0mm(minimum)forallexcept3mm
forC0G.Flexibleterminationsystem–3.0mm(minimum).
Solderability J–STD–002
Magnication50X.Conditions:
a)MethodB,4hoursat155°C,dryheatat235°C
b)MethodBat215°Ccategory3
c)MethodD,category3at260°C
TemperatureCycling JESD22MethodJA–104
1,000Cycles(−55°Cto+125°C).Measurementat24hours+/−4hoursaftertest
conclusion.
BiasedHumidity
MIL–STD–202Method
103
LoadHumidity:1,000hours85°C/85%RHandratedvoltage.Add100Kohmresistor.
Measurementat24hours+/−4hoursaftertestconclusion.
LowVoltHumidity:1,000hours85°C/85%RHand1.5V.Add100Kohmresistor.
Measurementat24hours+/−4hoursaftertestconclusion.
MoistureResistance
MIL–STD–202Method
106
t=24hours/cycle.Steps7aand7bnotrequired.
Measurementat24hours+/−4hoursaftertestconclusion.
ThermalShock
MIL–STD–202Method
107
−55°C/+125°C.Note:Numberofcyclesrequired–300,maximumtransfertime–20
seconds,dwelltime–15minutes.Air–Air.
HighTemperatureLife
MIL–STD–202Method
108
/EIA–198
1,000hoursat125°C(85°CforX5R,Z5UandY5V)with2Xratedvoltageapplied.
StorageLife
MIL–STD–202Method
108
150°C,0VDCfor1,000hours.
Vibration
MIL–STD–202Method
204
5g'sfor20minutes,12cycleseachof3orientations.Note:Use8"X5"PCB0.031"thick
7securepointsononelongsideand2securepointsatcornersofoppositesides.Parts
mountedwithin2"fromanysecurepoint.Testfrom10–2,000Hz
MechanicalShock
MIL–STD–202Method
213
Figure1ofMethod213,ConditionF.
Resistance to Solvents
MIL–STD–202Method
215
Addaqueouswashchemical,OKEMCleanorequivalent.
Storage and Handling
Ceramicchipcapacitorsshouldbestoredinnormalworkingenvironments.Whilethechipsthemselvesarequiterobustin
otherenvironments,solderabilitywillbedegradedbyexposuretohightemperatures,highhumidity,corrosiveatmospheres,
andlongtermstorage.Inaddition,packagingmaterialswillbedegradedbyhightemperature–reelsmaysoftenorwarp
andtapepeelforcemayincrease.KEMETrecommendsthatmaximumstoragetemperaturenotexceed40ºCandmaximum
storagehumiditynotexceed70%relativehumidity.Temperatureuctuationsshouldbeminimizedtoavoidcondensationon
thepartsandatmospheresshouldbefreeofchlorineandsulfurbearingcompounds.Foroptimizedsolderabilitychipstock
shouldbeusedpromptly,preferablywithin1.5yearsofreceipt.