- Hewlett-Packard Reference Manual

Test Sample Chromatograms
Test sample chromatograms
236
Detector Type ECDw/MUG
Temp 300 DEGREES C
Inlet Type Ded
On-Column
Oven Track On
Temp N/A
Operating Mode N/A
Purge Time On N/A min
Purge Time Off N/A
min
Oven Isothermal
Init Temp 170
DEGREES C
Init Time N/A
min
Ramp
Rate 0
Fin Temp
Fin Time
Flow Param (EPP)
Constant Flow Off
Range 2
COLUMN:
Part No. 19095S(#100)
Dimensions 530 MID; 5 m
Sta Phase Methyl
Silicone
.4
1.29
.
5
3.
5
FLOW RATES
Carrier (He) 15 +/• 1 ml/min
Hydrogen N/A ml/min
Air N/A ml/min
Makeup (N2) 60+/•2 ml/min
Split Vent N/A ml/min
Septum Purge 60+/•1 ml/min
SAMPLE:
Type ECD Sample
Inj Volume 1
l
Part No. 18713•60040
Composition 33 pg/
l
(0.033 ppm (W/V)) each: lindane
and aldrin in isooctane
LINDANE
ALDRIN
HP 5890 Test Sample Operating
Conditions
ECD-On-Column Capillary Inlet
Figure 10-12.