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Intelligent Platforms

Deployed Test

Features/Benefits Summary

Features Function/Beneﬁts

Two Deployed Test

software components

offered (BIT and BCS)

Each tailored for a different test-phase/strategy. Use of both provides the best possible overall Deployed Test strategy, adapted for

the realities of merchant silicon and the use of a standard COTS operating system (OS).

Built-in test (BIT)

Completely OS-independent.

Intrusive

Intrusive testing provides the highest possible coverage and conﬁdence.

Initialization phase only

Ensures no intrusive testing can possibly disturb the OS or application.

95% or better coverage

Functionally veriﬁable, using the ‘stuck nodes’ method with statistically valid sample sizes for fault injection.

Optional ‘Edge Node’ tests

Additional to the ‘Internal Node’ tests that are fully onboard the single board computer (SBC). Allows the use of standard BIT for accep-

tance test procedures (ATP), as well as deployment. No separate ATP software needs to be commissioned. Also, some ‘edge node’ tests

can usually be enabled in deployment, increasing the overall system test coverage. Standardized responses are veriﬁed wherever

possible (e.g. normal response to an initiated Ethernet ‘ping’).

Highly conﬁgurable

Standard BIT product can be used in almost all circumstances, without recourse to source code, or invoking development time.

Automatic or

interactive testing

Conﬁgure and forget, or use for ﬁrst stage ﬁeld diagnosis.

High test-resolution

ﬂexibility

Can balance the best depth of coverage for the required maximum execution time, giving a best ﬁt to the application circumstances.

Fast BIT

‘Best coverage in one second’ option.

Fast Start

Bypasses all tests in an emergency start-up condition (e.g. an in-air brown-out). Fast Start situation sampled from the backplane.

Flexible results storage

For easy integration, BIT can store results in nominated Flash, RAM, or bus memory locations, for later pick-up by the application.

Immediate failure

indication

Via an SBC LED: also a backplane output for system notiﬁcation.

System-wide

Minimizes integration. BIT tests and collates results for all GE Intelligent Platform boards/daughter boards connected in the system.

Field upgradeable

Later GE Intelligent Platform BIT versions that run a wider range of hardware can be ﬁeld-installed on older boards, providing unit

compatibility or cross-program commonality.

Extendable

Custom tests (e.g. for proprietary PMCs) easily added using a standard template. No purchase of BIT source code is required for this purpose.

Summary of content (2 pages)

PAGE 1
GE Intelligent Platforms Deployed Test Features/Benefits Summary Features Function/Benefits Two Deployed Test software components offered (BIT and BCS) Each tailored for a different test-phase/strategy. Use of both provides the best possible overall Deployed Test strategy, adapted for the realities of merchant silicon and the use of a standard COTS operating system (OS). Built-in test (BIT) Completely OS-independent.
PAGE 2
Deployed Test - Features/Benefits Summary Features Benefits Table Features Function/Benefits Standard source product BIT source is a standard product offering, allowing BIT merging to user-specific test harnesses, or adaptation for other purposes. Serial style Man Machine Interface (MMI) Local serial terminal for the easiest connection, or optional ‘serial over Ethernet’† (host telnet session), allowing connection and ‘same menu’ configuration by remote users.