Un-Intentional Intentional Radiator Test Report For the PI Engineering Inc. X-Keys XK-16 Tested under The FCC Rules contained in Title 47 of the CFR, Part 15 Subpart B For Class B Digital Device March 01, 2012 Prepared for: PI Engineering Inc. 101 Innovation Parkway Williamston, MI 48895-1663 Prepared By: Reviewed By: H.B. Compliance Solutions 254 W.
Report Status Sheet Revision # Ø HBCS Report # FCC_12003 Report Date March 01, 2012 Reason for Revision Initial Issue Page 2 of 17
Table of Contents EXECUTIVE SUMMARY ............................................................................................4 1. Testing Summary ........................................................................................4 EQUIPMENT CONFIGURATION ................................................................................5 1. Overview ....................................................................................................5 2. Test Facility................................
EXECUTIVE SUMMARY 1. Testing Summary These tests were conducted on a sample of the equipment for the purpose of demonstrating compliance with Part 15. All tests were conducted using measurement procedure from ANSI ANSI C.63.4 2003 as appropriate. Test Name Conducted Emissions Radiated Emissions HBCS Report # FCC_12003 Test Method/Standard 15.107 15.
EQUIPMENT CONFIGURATION 1. Overview H.B Compliance Solutions was contracted by PI Engineering to perform testing on the X-Keys XK-16 under the purchase order number 012312PVE. This document describes the test setups, test methods, required test equipment, and the test limit criteria used to perform compliance testing of the PI Engineering, X-Keys Model # XK-16. The tests were based on FCC Part 15 Subpart B Rules.
2. Test Facility Radiated Emission testing was performed at Emerson Network Power. This facility is located at 2900 S. Diablo Way, Suite 190, Tempe, AZ 85282. All equipment used in making physical determination is accurate and bears recent traceability to the National Institute of Standards and Technology. Test facility at Emerson Network power is an A2LA accredited test site. The A2LA certificate number is 2716.01.
. Method of Monitoring EUT Operation LED’s on the front of the device was monitored for any errors. Also one of the keys was pressed on the device to produce a constant character on the screen of a laptop which was observed throughout the testing test. 8. Mode of Operation The EUT will be configured in its normal operating mode. 9. Modifications 9.1 Modifications to EUT Modifications were made to the EUT to meet Radiated Emissions requirements. 0.
Criteria for Un-Intentional Radiators 1. Conducted Emissions §15.107 None Test Requirement(s): Test Results: Test Procedures: Test Engineer(s): Test Date(s): None None The EUT was placed on a non-metallic table, 80cm above the ground plane inside a shielded enclosure. The EUT was powered through a 50Ω/50μH LISN. The conducted emissions tests were performed using the mode of operation and configuration noted within this report. The frequency range investigated (scanned), is also noted in this report.
2. Radiated Emissions Test Requirement(s): Test Results: §15.109 Test Engineer(s): Frank Farrone Pass Test Date(s): 02/23/12 Test Procedures: The final radiated emissions test was performed using the parameters described above as worst case. That final test was conducted at a facility that meets the ANSI C63.4 NSA requirements. The frequency range noted in the data sheets was scanned/tested at that facility.
Emissions Tests Calculations In the case of indoor measurements, radiated emissions measurements are made by the manipulation of correction factors using Rohde and Schwarz ES-K1 software. This is done automatically by the software during the final measurement process. In both cases, the level of the Field Strength of the interfering signal is calculated by adding the Antenna Factor, Cable Factor and by subtracting the Amplifier Gain from the measured reading.
Level [dBµV/m] 80 70 60 50 x xx x x 40 x 30 20 10 0 x 30M 40M 50M x MES MES LIM 70M 100M 200M 300M 400M Frequency [Hz] XKey_2-23_0_red XKey_2-23_0_pre FCC_Class B_3M 600M 1G PK PK Plot 3 – Radiated Emissions – 30MHz to 1GHz Frequency (MHz) 118.58 192.63 765.33 800.00 875.55 896.88 Measured Level 40.25 35.20 37.44 37.77 38.01 40.38 Height (cm) 300 100 100 100 200 100 Azimuth (deg) 135 135 135 135 315 135 Polarization Horizontal Vertical Horizontal Horizontal Vertical Horizontal Table 4.
Test Setup Photo 1 – Radiated Emissions Test Setup Photo 2 – Radiated Emissions HBCS Report # FCC_12003 Page 12 of 17
3.
15.105(b) Information to the User (For Class B equipment only) For a Class B digital device or peripheral, the instructions furnished the user shall include the following or similar statement, placed in a prominent location in the text of the manual: NOTE: This equipment has been tested and found to comply with the limits of Part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interference in a residential installation.
The applicant has been cautioned as to the following: 15.27(a) Special Accessories. Equipment marketed to a consumer must be capable of complying with the necessary regulations in the configuration in which the equipment is marketed. Where special accessories, such as shielded cables and/or special connectors are required to enable an unintentional or intentional radiator to comply with the emission limits in this part, the equipment must be marketed with, i.e.
47 CFR 15.19 Labeling requirements. (b) Products subject to authorization under a Declaration of Conformity shall be labeled as follows: (1) The label shall be located in a conspicuous location on the device and shall contain the unique identification described in §2.
(3) When the device is so small to for such use that it is not practicable to place the statement specified under paragraph (b)(1) of this section on it, such as for CPU board or plug-in circuit board peripheral device, the text associated with the logo may be placed in a prominent location in the instruction manual or pamphlet supplied to the user. However, the unique identification (trade name and model number) and the logo must be displayed on the device.
EMC Test Report For the PI Engineering Inc. X-Keys XK-16 Tested under EN 55022: 2007 & EN 55024: 1998 Information Technology Equipment Radio Disturbance & Immunity Characteristics February 24, 2012 Prepared for: PI Engineering Inc. 101 Innovation Parkway Williamston, MI 48895-1663 Prepared By: Reviewed By: H.B. Compliance Solutions 254 W.
Report Status Sheet Revision # Ø HBCS Report # EMC_12003 Report Date February 24, 2012 Reason for Revision Initial Issue Page 2 of 36
Table of Contents Compliance Criteria ................................................................................................5 EXECUTIVE SUMMARY ............................................................................................6 1. Testing Summary ........................................................................................6 EQUIPMENT CONFIGURATION ................................................................................7 1. Overview ..................................
6. Electrical Fast Transient (EFT)/Burst .........................................................26 7. Surge ........................................................................................................28 8. Conducted Immunity ................................................................................30 9. Magnetic Immunity ..................................................................................32 10. Voltage Dips & Interruptions ...........................................
Compliance Criteria The EUT is considered immune to the threat environment if the compliance criteria provided below are met. These compliance criteria are taken from EN 55024 Section 7.0 For all the immunity tests, the results are evaluated against performance criteria relating to the operating conditions and functional specifications of the EUT, and defined as follows: – Performance Criterion A: The EUT shall continue to operate as intended without operator intervention.
EXECUTIVE SUMMARY 1. Testing Summary These tests were conducted on a sample of the equipment for the purpose of demonstrating compliance with EN 55022 & 55024. All tests were conducted using measurement procedure from CISPR 16 as appropriate.
EQUIPMENT CONFIGURATION 1. Overview H.B Compliance Solutions was contracted by PI Engineering to perform testing on the X-Keys XK-16 under the purchase order number 012312PVE. This document describes the test setups, test methods, required test equipment, and the test limit criteria used to perform compliance testing of the PI Engineering, X-Keys XK-16. The tests were based on EN 55022 & EN 55024 standards.
3. Description of Test Sample The PI Engineering, is a USB keyboard which has been designed to offer extra programmable keys. It runs off USB power port of a computer which is 5Vdc. 4. Equipment Configuration Ref. ID #1 Name / Description X-Keys XK-16 Stick Model Number XK-0981-UCK16 Serial Number None Table 1. Equipment Configuration 5. Support Equipment All support equipment supplied is listed in the following Support Equipment List.
9. Modifications 9.1 Modifications to EUT Modifications were made to the EUT to meet Radiated Emissions requirements. 0.01uF by pass capacitor was placed near the U1 power pins on the Printed Circuit Board. 9.2 Modifications to Test Standard No Modifications were made to the test standard. 10. Disposition of EUT The test sample including all support equipment submitted to H.
Criteria for Emissions 1. Conducted Emissions EN 55022:2007 N/A Test Requirement(s): Test Results: Test Procedures: Test Engineer(s): Test Date(s): None None The EUT was placed on a non-metallic table, 80cm above the ground plane inside a shielded enclosure. The EUT was powered through a 50Ω/50μH LISN. The conducted emissions tests were performed using the mode of operation and configuration noted within this report. The frequency range investigated (scanned), is also noted in this report.
2. Radiated Emissions Test Requirement(s): Test Results: EN 55022/A1: 2007 Test Engineer(s): Frank Farrone Pass Test Date(s): 02/23/12 Test Procedures: The final radiated emissions test was performed using the parameters described above as worst case. That final test was conducted at a facility that meets the ANSI C63.4 NSA requirements. The frequency range noted in the data sheets was scanned/tested at that facility.
Frequency Range ( MHz) 30 –230 230 – 1000 55022, Class A Limits (dBuV) Quasi-Peak 50 57 55022, Class B Limits (dBuV) Quasi Peak 40.5 47.5 Note 1 – The lower limit shall apply at the transition frequencies. Table 8. Radiated Emissions Limits below 1GHz – Limits from EN 55022 Frequency Range ( GHz) 1–3 3–6 55022, Class A Limits (dBuV) Average Peak 56 76 60 80 55022, Class B Limits (dBuV) Average Peak 50 70 55 74 Note 1 – The lower limit shall apply at the transition frequencies. Table 9.
Emissions Tests Calculations In the case of indoor measurements, radiated emissions measurements are made by the manipulation of correction factors using Rohde and Schwarz ES-K1 software. This is done automatically by the software during the final measurement process. In both cases, the level of the Field Strength of the interfering signal is calculated by adding the Antenna Factor, Cable Factor and by subtracting the Amplifier Gain from the measured reading.
Level [dBµV/m] 80 70 60 50 x xx x x 40 x 30 20 10 0 x 30M 40M 50M x MES MES LIM 70M 100M 200M 300M 400M Frequency [Hz] XKey_2-23_0_red XKey_2-23_0_pre FCC_Class B_3M 600M 1G PK PK Plot 3 – Radiated Emissions – 30MHz to 1GHz Class B Limits Frequency (MHz) 118.58 192.63 765.33 800.00 875.55 896.88 Measured Level 40.25 35.20 37.44 37.77 38.01 40.
Radiated Emission Test Setup Photos Test Setup Photo 1– Radiated Emissions Test Setup Photo # 2 – Radiated Emissions HBCS Report # EMC_12003 Page 15 of 36
3. Harmonics Current Emissions Test Requirement(s): Test Results: EN 61000-3-2:2001 Test Engineer(s): None None Test Date(s): None Test Procedures: Switch-mode power supplies can draw high harmonic currents from the AC mains, which can cause a variety of undesirable effects in the ac power distribution system. The end result for electronic products connected to the AC mains can be improper operation, over-stressed ac input components and product failure.
The peak value of the test voltage shall be with 1.40 and 1.42 times its r.m.s. value and shall be reached within 87degrees to 93degrees after the zero crossing. This requirement does not apply when Class A or B equipment is tested. Equipment Classification Class A: Balanced three-phase equipment and all other equipment, except that stated in one of the following classes. Class B: Portable tools and arc welding equipment which is not professional equipment.
4. Voltage Fluctuations and Flicker Test Requirement(s): Test Results: EN 61000-3-3: 1995 (A1:2001) None Test Engineer(s): None Test Date(s): None Test Procedures: The power quality of the AC mains can deteriorate due to voltage fluctuations caused by devices such as electronic ballast’s and light dimmer switches. The phase-controlled ac input of these devices may cause large rms current changes on the AC mains, which result in substantial rms voltage deviations.
Voltage Fluctuations and Flicker Test Data Test Parameters PST Integration Time Line Voltage (V) PST Integration Periods Pst Errors Test Duration Plt Errors Frequency (Hz) Dt Errors Comments None EUT Operating Modes Deviations From Test Standard None Results N/A HBCS Report # EMC_12003 Page 19 of 36
Criteria for Immunity 5. Electrostatic Discharge (ESD) Test Requirement(s): Test Results: EN 61000-4-2: 1999 Test Engineer(s): Frank Farrone Pass Test Date(s): 02/08/2012 Test Procedures: An ESD Immunity test was performed using the mode of operation and configuration noted within this report. The EUT was tested using air and contact discharges. The specified number of air discharges was applied to each of the non-conductive surfaces of the EUT as listed in the test data below.
ESD Test Data Test Polarity Tested (+/-) Discharge Type Application (y/n) EUT Susceptibility Level Amplitude (kV) 1 2 + Contact Direct Yes None 1 2 - Contact Direct Yes None 2 4 + Contact Direct Yes None 2 4 - Contact Direct Yes None 1 2 + Air Direct Yes None 1 2 - Air Direct Yes None 2 4 + Air Direct Yes None 2 4 - Air Direct Yes None 3 8 + Air Direct Yes None 3 8 - Air Direct Yes None 1 2 + Contact Indirect Yes None 1
ESD Test Setup Photo Test Setup Photo # 3 - ESD Test Setup Photo # 4 - ESD Test Setup Photo # 5 - ESD Test Setup Photo # 6 - ESD HBCS Report # EMC_12003 Page 22 of 36
Radiated Immunity Test Requirement(s): Test Results: EN 61000-4-3: 2001 Test Engineer(s): Frank Farrone Pass Test Date(s): 02/08/2012 Test Procedures: This test determines the radiated immunity characteristics of the EUT between 80 MHz and 1.0 GHz, per the spec limits given in EN 55024 Table 1. The test was run per the procedures given in EN 61000-43.
Radiated Immunity Test Data Test Parameters Start Frequency (MHz): 80 Start Frequency (MHz): N/A Start Frequency (MHz): N/A Start Frequency (MHz): N/A Modulation Frequency: 1 KHz Modulation Depth (%): 80 Comments: None EUT Operating Modes: Normal Deviations From Test Standard: None EUT Functions Monitored: Stop Frequency (MHz): Stop Frequency (MHz): Stop Frequency (MHz): Stop Frequency (MHz): Modulation Type: Polarities Tested: 1 GHz N/A N/A N/A AM 2 Test Level (V/m): >3 Test Level (V/m): N/A Test Level
Radiated Immunity Test Setup Photo Test Setup Photo # 7 - ESD Test Setup Photo # 8 - ESD Test Setup Photo # 9 - ESD Test Setup Photo # 10 - ESD HBCS Report # EMC_12003 Page 25 of 36
6. Electrical Fast Transient (EFT)/Burst Test Requirement(s): Test Results: EN 61000-4-4: 1995 (A1,A2:2001) None Test Engineer(s): None Test Date(s): None Test Procedures: An EFT/Burst Immunity test was performed using the mode of operation and configuration noted within this report.
Electrical Fast Transient Test Data Test Parameters Burst rep rate: Burst Duration: Comments Burst Freq (<2kV): Burst Freq (>2kV): Pulse Duration: Pulse Rise Time: Pulse Amplitude: EUT Operating Modes Deviations From Test Standard None EUT Functions Monitored Results N/A Meets Performance Criteria Criteria Line Under Test Coupling Mode L-E + L-E - N-E + N-E - L+N-E + L+N-E - PE-E + PE-E - L+PE-E + L+PE-E - N+PE-E + N+PE-E - L+N+PE-E + L+N+PE-E - AC Power Line Signal Lines
7. Surge Test Requirement(s): Test Results: EN 61000-4-5: 1995 (A1:2001) None Test Engineer(s): None Test Date(s): None Test Procedures: A Surge Immunity test was performed using the mode of operation and configuration noted within this report. The task of the defined laboratory test is to find the reaction of the EUT under specified operational conditions caused by surge voltages from switching and lightning effects at certain threat levels.
Surge Test Data Test Parameters Open Circuit Voltage, Risetime: Short-Circuit Current Risetime: Surge Repetition Rate: Short-Circuit Current time to ½ Value: Open Circuit Voltage, Time to ½ Value: Comments None EUT Operating Modes Normal Deviations From Test Standard None EUT Functions Monitored Results N/A Meets Test Criteria Test Amplitude (V) Test Level HBCS Report # EMC_12003 Polarity (+/-) Coupling Type Power or Signal Line + Line to Earth AC - Line to Earth AC + Line to Earth AC - Li
8. Conducted Immunity Test Requirement(s): Test Results: EN 61000-4-6 (A1:2004, A2:2006) None Test Engineer(s): None Test Date(s): None Test Procedures: A Conducted RF Immunity test was performed using the mode of operation and configuration noted within this report. The source of disturbance covered by the standard is basically an electromagnetic field, coming from intended RF transmitters, that may act on the whole length of cables connected to installed equipment.
Conducted Immunity Test Data Test Parameters Test Level: Start Frequency: Step Size: Comments None EUT Operating Modes Spec. Level: Stop Frequency: Dwell Time: Modulation Freq.
9. Magnetic Immunity Test Requirement(s): Test Results: EN 61000-4-8: 1993 (A1:2001) None Test Engineer(s): N/A Test Date(s): N/A Test Procedures: A Magnetic Immunity test was performed using the mode of operation and configuration noted within this report. The test was run per the procedures given in EN 61000-4-8. The EUT and any associated equipment that is part of the test set up, and I/O cables is placed on top of 10-cm spacers above the ground plane.
Magnetic Field Immunity Test Data Test Parameters Test Level: Comments Spec. Level: Power Freq.
10. Voltage Dips & Interruptions Test Requirement(s): Test Results: EN 61000-4-11: 1994 (A1:2001) None Test Engineer(s): None Test Date(s): None Test Procedures: A Voltage Dip and Voltage Interruption Immunity test was performed using the mode of operation and configuration noted within this report. The standard applies to electrical and electronic equipment having a rated input current not exceeding 16 A per phase. It does not apply to electrical and electronic equipment for connection to D.C.
Voltage Dips and Interruptions Test Data Test Parameters Comments None EUT Operating Modes Deviations From Test Standard None EUT Functions Monitored Results N/A Meets Performance Criteria Nominal Voltage = 230V Susceptibility Criteria > -95% @ 10 ms (0.5 cy) B -30% @ 0.5 s (25 cy) C < -95% @ 5 s (250 cy) C Nominal Voltage = 120V Susceptibility Criteria > -95% @ 10 ms (.5 cy) B -30% @ 0.
Test Equipment Equipment Manufacturer Model Serial # Last Cal Date Cal Due Date EMI Receiver Bilog Antena EMI Receiver Rohde & Schwarz Chase Rohde & Schwarz ESCS-30 CBL6140 ESMI 828985/007 1040 840607/005 09-03-11 12-06-11 12-17-11 09-03-12 12-06-12 12-17-12 ESD Simulator Signal Generator RF Millivoltmeter 10dB Attenuator Directional Coupler Data Processing Unit Field Probe Bilog Antenna Amplifier Schaffner Rohde& Schwarz Boonton Mini Circuits Werlatone Emco Emco Schaffner Amplifier Research Xi
P.I. Engineering 101 Innovation Pkwy Williamston, MI 44895 Date: November 2013 To Whom It May Concern: Subject: RoHS directive 2002/95/EC and California SB20 Compliance ____P.I.
