Agilent PNA-X Series Microwave Network Analyzers Reach for unrivaled excellence 1
Choose the leader in network analysis Industry’s Most Advanced RF Test Solution Reach for unrivaled excellence The PNA-X Series of microwave network analyzers are the culmination of Agilent’s 40-year legacy of technical leadership and innovation in radio frequency (RF) network analysis. More than just a vector network analyzer, the PNA-X is the world’s most integrated and flexible microwave test engine for measuring active devices like amplifiers, mixers, and frequency converters.
Replace racks and stacks With its highly integrated and versatile hardware and re-configurable measurement paths, the PNA-X replaces racks and stacks of equipment – with a single instrument. One PNA-X can take the place of the following test gear: Multiple measurements with a single instrument • • • • • • • Network analyzer Spectrum analyzer Two signal sources Noise figure meter/analyzer Power meters Switch matrix Digital voltmeter Benefits of a PNA-X-based solution • Simpler test systems for... ...
Bottom Line Results – PNA-X Case Studies “We selected Agilent’s PNA-X because it eliminated unnecessary cable swaps between measurements and it makes more active measurements than any other network analyzer out there. We used to make S-parameter, vector-signal, and noisefigure measurements with separate test equipment—and now with the PNA-X, we can perform all of our active measurements in one box.
CASE STUDY 3 Wireless networking systems manufacturer reduces throughput from 30 to 10 minutes Challenges The manufacturer was developing a new broadband wireless network system and needed a faster test system. Its existing test system consisted of two sources, a spectrum analyzer, and power meters. Using this system, they estimated their new product would take 30 minutes to test; however their speed goal was 15 minutes.
Intuitive, Speed-driven Features Flexible user interface: hard keys, soft keys, pull-down menus, and touch screen Configurable test set available on all models Up to 10 markers per trace State-of-the-art calibration capabilities Linear, log, power, CW, phase, and segment sweeps 200 measurement channels and unlimited traces Equation editor and time-domain analysis 6 On-line help Quick access for ECal and other USB devices
Hardware for Exceptional Flexibility Second GPIB interface for controlling signal sources, power meters or other instruments Pulse I/O connector for controlling external modulators or synchronizing internal pulse generators RF jumpers for adding signalconditioning hardware or other test instruments Direct IF access for remote mixing in antenna ranges Test set I/O for controlling external multiport and millimeter-wave test sets LAN and device-side USB interfaces provide alternatives to GPIB for remote
Flexible Architecture 1 Each test port includes test and reference couplers and receivers, source and receiver attenuators, and a bias tee, for maximum accuracy and flexibility. 1 2 The built-in signal combiner greatly simplifies the setup for intermodulation distortion and X-parameter measurements. 2 3 Internal pulse modulators enable integrated pulsed-RF testing over the full frequency range of the instrument, eliminating expensive and bulky external modulators.
3 4 Switchable rear-panel jumpers provide the flexibility to add signal-conditioning hardware or route additional test equipment to the DUT without moving test cables. 4 5 Setting up pulse timing for the pulse modulators and internal IF gates is easy using the built-in pulse generators. 5 6 Internal low-noise receivers, along with advanced calibration and measurement algorithms, provide the industry’s most accurate noise figure measurements.
Pulsed-RF measurement challenges • Pulse generators and modulators required for pulsed-RF measurements add complexity in test setups • For narrow pulses: – Maximum IF bandwidth of analyzer is often too small for wideband detection – Narrowband detection is slow, and measurements are noisy for low duty cycle pulses Innovative Applications Simple, fast and accurate pulsed-RF measurements PNA-X pulsed-RF measurements provide: (Options 008, 021, 022, 025) By the 1990s, the HP 8510 was the industrystandard fo
Tips from the experts • Compared to sweep averaging, point averaging typically provides faster results when averaging is needed to lower noise and improve accuracy of measurements using wideband detection. • During source power calibrations, power sensors read the average power, while the analyzer sets the peak power of the pulsed stimulus. To compensate for the difference between the peak and average power, use the power offset feature with the value of 10 log (duty cycle).
Noise figure measurement challenges with traditional, Y-factor approach Innovative Applications Fast and accurate noise figure measurements (Options 028, 029) • Multiple instruments and multiple connections required to fully characterize DUT • Measurement accuracy degrades in-fixture, on-wafer, and automated-test environments, where noise source cannot be connected directly to DUT • Measurements are slow, often leading to fewer measured data points and misleading results due to under-sampling PNA-X noise
Noise-parameter measurements in minutes rather than days Setting up and making noise-parameter measurements is simple and fast using a PNA-X and a Maury Microwave automated tuner. Maury’s latest software dramatically improves both the speed and accuracy of noise-parameter measurements, making them a practical option for all RF engineers. Noise figure measurement methods DUT DUT Noise receiver Noise receiver Y-FACTOR: The most prevalent method for measuring noise figure is the Y-factor technique.
PNA-X’s unique source-corrected noise figure solution • Uses modified cold-source method, eliminating need for noise source when measuring DUT • Corrects for imperfect system source match by using vector correction to remove mismatch errors plus an ECal module used as an impedance tuner to remove noise-parameterinduced errors • Maintains high measurement accuracy in fixtured, on-wafer, or automated-test environments • Accurately measures differential devices using vector deembedding of baluns or hybrids In
Tips from the experts • Noise figure measurements are best done in a screen room to eliminate spurious interference from mobile phones, wireless LAN, handheld transceivers, etc. • Batteries are sometimes used instead of mains-based power supplies to eliminate conducted interference from sensitive LNA measurements • Overall measurement accuracy can be estimated by using Agilent’s Monte-Carlo-based noise figure uncertainty calculator Agilent’s PNA-X noise figure uncertainty calculator (www.agilent.
Gain compression measurement challenges Innovative Applications Fast and accurate gain compression versus frequency measurements of amplifiers and converters (Option 086) Gain • Characterizing amplifier or frequency converter compression over its operating frequency range requires measurements at many frequency and power points, so setting up the measurements, calibration, and data manipulation takes a lot of time and effort • A variety of errors degrade measurement accuracy, such as mismatch between the
Available compression methods The linear gain is measured using the specified linear (input) power level. The compression point is calculated as the linear gain minus the specified compression level. Linear gain Compression point Specified compression level Gain Compression from linear gain Input power The highest gain value that is found at each frequency is used as the max gain. The compression point is calculated as the max gain minus the specified compression level.
IMD measurement challenges Innovative Applications Fast two-tone intermodulation distortion (IMD) measurements with simple setup (Option 087) Swept-frequency IMD • Two signal generators, a spectrum analyzer, and an external combiner are most commonly used, requiring manual setup of all instruments and accessories • Test times are slow when swept-frequency or swept-power IMD is measured • Instruments and test setups often cause significant measurement errors due to source-generated harmonics, cross-modula
Swept IMD sweep types Sweep fc Sweep Delta F Power Sweep CW Center Frequency Swept Fixed Fixed Fixed Fixed Tone Spacing Fixed Swept Fixed Fixed Fixed Fixed Tone Powers Fixed Fixed Fixed Fixed Fixed Diagram Swept (coupled or uncoupled) LO Power Sweep Segments Swept (as defined by segment table) Delta F Delta F f1 fc Delta F f2 f1 fc Delta F Delta F f2 f1 f1 fc Delta F Delta F f2 f2 f1 fc f1 f2 fc f2 LO f1 fc f2 f1 fc Delta F f2 f1 fc f2 Tips from the expe
Mixer and converter measurement challenges SMC+Phase • Traditional approach with spectrum analyzer and external signal sources is cumbersome, slow, and does not provide phase or group delay information • Conventional VNAs require an external signal source, which degrades sweep speed • Conventional VNAs provide phase or group delay data relative to a “golden” device • Attenuators are often used to minimize ripple due to input and output mismatch, at the expense of dynamic Option 083’s Scalar Mixer/Converter
Swept LO Fixed IF Fixed LO Swept IF DUT Both SMC and VMC can be used to measure converters with embedded LOs, without need for access to internal time bases. With two internal signal sources, the PNA-X provides fast measurements of both fixed and swept IF responses. SMC’s match correction greatly reduces mismatch errors in conversion loss/gain measurements, eliminating the need for attenuators at the ends of the test cables.
Amplifier load-pull measurement challenges Innovative Applications Control relative magnitude and phase between two sources for active output-load control • Amplifier gain, output power, and power efficiency are commonly measured under different output-load conditions to determine the optimum large-signal match • Traditional approach uses mechanical tuners which can handle high power, but are slow and cannot supply highly reflective loads PNA-X with source-phase control provides • • • • Control of secon
I/Q and differential converter measurement challenges Innovative Applications Simplified test of I/Q converters and modulators, and differential mixers (Option 089) • Requires signals with 90% or 180% phase difference • Traditional approach uses hybrid couplers and/or baluns which are: • Inherently band-limited, requiring multiple components for broadband measurements • Limited to fixed phase offsets, preventing phase sweeps to determine optimum alignment • Lossy and inaccurate (+/- 3% to 12% typically) •
Differential amplifier measurement challenges Innovative Applications Testing differential amplifiers under real operating conditions (Option 460) • Conventional two-port VNAs with baluns do not provide common-mode, differential to common-mode, and common to differential-mode responses Differential • Baluns are inherently band-limited devices, (180 out-of-phase) which forces multiple test setups for broad frequency coverage • Phase errors of baluns provide inaccurate Common differential responses (in-phas
Actual Sdd21: Peaked at -5 degree phase offset Power or Gain Ideal Sdd21: peaked at 0 degree phase offset 3 4 Differential -10 input power-5 0 +10 Phase Offset (degrees from perfect differential) In-fixture phase-offset sweeps reveal the optimal phase offset to achieve the highest amplifier gain, which is essential to the design of the input matching circuit. 1 2 Phase-offset sweeps change the phaseoffset value as if it were added in the fixture, enabling input-matching circuit validation.
Powerful AFR features can handle a variety of measurement needs Innovative Applications Powerful, fast and accurate automatic fixture removal (AFR) • • • • • • • Single ended and differential devices Left and right side of fixture can be asymmetrical Thru lengths can be specified or determined from open or short measurements Band-pass time-domain mode for band-limited devices Extrapolation to match DUT frequency range Power correction compensates for fixture loss versus frequency De-embed files can be sa
AFR accuracy is comparable to on-board TRL calibration, but much easier to accomplish. A relative comparison of various fixture error-correction methods Measurement example Beatty Standard DUT In the plots below, the green trace is a measurement of a Beatty Standard DUT before AFR fixture removal. The red trace is the DUT with AFR open-standard fixture removal. The blue trace is the DUT with AFR thru-standard fixture removal. Fixture mismatch and length is removed from the DUT measurements.
PNA-X’s unique hardware architecture provides: • Two- and four-port solutions for measurements on a wide variety of single-ended and balanced millimeter-wave devices • True-mode differential measurements at millimeter-wave frequencies using two internal sources • Fully integrated solution for millimeter-wave pulse measurements using built-in pulse modulators, pulse generators, and receiver gates • Accurate leveled power at millimeter-wave frequencies with advanced source-power calibration methods • Direct c
Integrated pulse measurements Gain compression The PNA-X’s internal pulse modulators create pulsed-RF signals for the millimeter-wave modules, making it easy to set up and perform pulsed millimeter-wave measurements. Using calibrated source-power sweeps, the PNA-X provides the most accurate millimeterwave gain-compression measurements in the industry. Pulse profile at 77 GHz using the internal pulsed source and IF gates of the PNA-X.
High-power design challenges Innovative Applications Nonlinear waveform and X-parameter characterization • Active devices are commonly driven into nonlinear regions, often by design to increase power efficiency, information capacity, and output power • Under large-signal drive conditions, active devices distort time-domain waveforms, generating harmonics, intermodulation distortion, and spectral regrowth • Current circuit simulation tools that rely on S-parameters and limited nonlinear behavioral models a
Breakthrough technology accurately characterizes nonlinear behaviors Testing today’s high-power devices demands an alternate solution—one that quickly and accurately measures and displays the device’s nonlinear behavior under large signal conditions, and provides an accurate behavioral model that can be used for linear and nonlinear circuit simulations. The Agilent nonlinear vector network analyzer (NVNA) and X-parameters* provide that solution.
Challenges of antenna and radar cross-section (RCS) measurements Innovative Applications Fast and accurate RF subsystem for antenna measurements • Many data points must be collected, resulting in long test times • Far-field and RCS measurements, signals can be close to the noise floor of the test receiver, resulting in noisy measurements • Large installed-software base exists for 8530A antenna receivers, which have been discontinued and are no longer supported AUT Delta elevation Sum Delta Azimuth Scann
Why should I migrate my 8530A system to the new PNA-X measurement receiver? • 8530A is no longer supported, so maintaining existing systems is getting harder and harder • PNA-X measurement receiver… – Offers built-in 8530A code emulation for full reuse of existing measurement software – Is fully compatible with your existing 8530A system components – Features 80 times improvement in data acquisition time – Contains an optional built-in high-output power source (Option 108) that can be used as an LO for remo
Innovative Applications Tips from the experts Fast and accurate RF subsystem for antenna measurements continued How can I control external sources? 1. Connect PNA-X to source via LAN or GPIB 2. Use External Device Configuration feature 3.
Outstanding Performance Specification and Feature Comparison N5249A N5241A N5242A N5244A N5245A N5247A Frequency range 10 MHz to 8.5 GHz 10 MHz to 13.5 GHz 10 MHz to 26.5 GHz N5244A 10 MHz to 43.
PNA-X Configuration Information PNA-X Network Analyzers Available options Description Additional information 2-ports, single source 2-ports, add internal 2nd source, combiner and mechanical switches 4-ports, dual source 4-ports, add internal combiner and mechanical switches Requires Options 200, one of 219 or H85, and 080 Option 080 recommended Requires Options 400, one of 419 or H85, and 080 Test set Option 200 Option 224 Option 400 Option 423 Power configuration Option 219 Option 419 Option H851 2
PNA-X Configuration Information PNA-X Network Analyzers Available options, continued Description Pulse, antenna, mm-wave Additional information Option 008 Pulsed-RF measurements Requires Option 025 Option 020 Add IF inputs for antenna and mm-wave Option 021 Add pulse modulator to internal 1st source Option 022 Add pulse modulator tointernal 2nd source Option 025 Add four internal pulsegenerators Option 118 Fast CW sweep Requires Option 224 or 400 Accessories Option 1CM Rack mount kit for
Gain deeper confidence Whether you’re testing active or passive devices, the right mix of speed and performance gives you an edge. In R&D, our vector network analyzers provide a level of measurement integrity that helps you transform deeper understanding into better designs. On the production line, our cost-effective VNAs provide the throughput and repeatability you need to transform parts into competitive components.
